At this year's Intersolar dated May 27th to 29th in Munich it's possible to
see the joint solution for layer thickness measurement from the companies tec5
and VITRONIC: State-of-the-art
inline spectroscopy technology for solar cell production can be found at tec5's
booth.
By cooperating in this area and bringing together the core competences of the
two companies, a new generation of color inspection was born – not just
reflection and color measurement at coated wafers but everything from service
to integration in the production line. This is what tec5 and VITRONIC are offering.
VITRONIC and tec5 have been working together since 2008 in the area of wafer
inspection. As a result an inline solution for reflection and color measurement
of the blue reflex coating was created. The spectroscopy technology records
the physical aspects of the reflex coating. On this basis the layer thickness
and the potential efficiency are calculated. Just by using fast diode array
technology the inspection within production cycle is possible. Application specific
software visualizes the measurement result of every wafer in real time. This
data is taken using nine measuring points. The user interface shows the user
not only the physical values but also the particular color values and the associated
layer thickness. Thereby the wafers can be effortlessly sorted by color. All
measurement results are saved and allow the tracking of every wafer.
The data can also be used for statistical analyses. In addition to the complete
integration into the system controller, an SEGS/GEM compliant transmission of
all measurement data is ensured.
Posted May 25th, 2009
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