Zemetrics, an optical
metrology product company founded last year to provide new concept surface metrology
systems, has brought its first system, ZeMapper, to the precision engineering
and R and D market.
The ZeMapper interferometric optical profiler provides three-dimensional surface
maps with the highest lateral and vertical resolution in a user-friendly automated
process. Its large image sensor of 4 mega-pixels combines a large field of view
with high resolution, unmatched in any commercial profiler. Advanced processing
of the interferometric data leads to rapid precision measurements with sub-Angstrom
repeatability. Designed for ultra-precision metrology, the instrument has been
beta-tested by research customers, and is now in production. ZeMapper is expected
to fill unmet needs in surface mapping among users that need non-destructive,
non-contact areal measurements with high resolution and repeatability in applications
such as defect review, surface characterization and volume displacement for
data storage, optics, MEMS, tribology, material and biological sciences.
The ZeMapsTM acquisition and analysis software, included with ZeMapper, is
optimized for the most powerful multiple processors, operating in 64-bit address
space computing environment. Built-in reporting, animated 3D mapping, and zooming
plots provide volumetric calculations, line profile cross-sections, and tabular
3D surface measurement parameters such as peak-to-valley, roughness (Sa), and
area step heights.
Zemetrics, a corporate member of both OSA and SPIE, is a privately owned company.
Offices are located in Tucson, Arizona. Its founders come from the optical surface
metrology industry, and are experienced optical, mechanical and software designers.
The company can be contacted through the web site (www.zemetrics.com), by phone
(520/202-4399), or by email (info@zemetrics.com). Zemetrics, ZeMapper and ZeMaps
are trademarks of Zemetrics, Inc.
Posted September 7th, 2009
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