Site Sponsors
  • Strem Chemicals - Nanomaterials for R&D
  • Oxford Instruments Nanoanalysis - X-Max Large Area Analytical EDS SDD
  • Park Systems - Manufacturer of a complete range of AFM solutions
Posted in | Nanomaterials

LOT-Oriel Announces Availability of SPEQUEST for Spectral Response Characterisation of Solar Cells

Published on May 7, 2009 at 7:35 AM

In today’s rapidly evolving markets for solar cells, the characterisation of the spectral response (quantum efficiency) is one of the most important parameters for research and development of new materials and devices but also for production and quality control.

Today still 90% of the solar cells manufactured around the world are single junction silicon devices; therefore the layout of a spectral response measurement system is relatively simple and straightforward. However, the most promising research areas focus on different devices and materials, e.g. thin film and 3rd generation devices, which require a different layout of a spectral response characterisation system.

SPEQUEST takes into account the latest developments in solar cell research, the modular and very flexible setup enables quick and simple adaptation to research and production requirements.

  • • Complete turnkey solution for spectral characterisation
  • • Modular setup for maximum flexibility
  • • All type of solar cells: polysilicon, c-Si, mc-Si, nc-Si
  • • III/V compound cells: thin film: CdTe, CIS, CIGS, Si, 3rd generation: organic polymer, dye
  • • Single and multijunction devices
  • • Spectral range 200 – 2500nm
  • • Variable bias light (white light or multicolour)
  • For more information please go to http://www.lot-oriel.com/site/pages_uk_en/products/spequest/spequest.php or call Shayz Ikram on 01372 378822, e-mail shayz@lotoriel.co.uk
Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Submit