Easier operation, superior functionality and optimised reproducibility of
measurements are delivered to end-users by the Carl
Zeiss Particle Analyzer. As well as particle analysis for technical purity,
the microscope-based analysis and documentation system may also be used for
the documentation of defects, materials analysis, porosity measurements of surfaces
and biomedical applications in the pharmaceutical industry and medical technology
Carl Zeiss Particle Analyzer delivers Increased Reproducibility for Automatic Quality Inspection
Special functions for particle recognition enable fully automatic measurement
without user intervention. Subsequent typification, such as reflecting or non-reflecting
particles and fibres for instance, has also been optimised to make manual correction
unnecessary. In addition, the SteREO Discovery range of stereomicroscopes and
the Axio Imager range of upright microscopes may be fully motorised and driven
by the software, with the system configuration stored with the results. Consequently,
consistent quality of measured results from batch-to-batch can be guaranteed,
regardless of a change in user. In addition, particle standard and special specimen
holders are available for system calibration.
Internationally recognised standards and directives, such as VDA Vol. 19 /
ISO 16232 and ISO 4406, are implemented within the software and company-specific
standards or demands outside the standards may also be implemented easily by
the user. Also, the directives of the US FDA (Food and Drug Administration)
can be implemented for applications in the pharmaceutical industry and medical
The Particle Analyzer software may be implemented with either the SteREO Discovery
range of stereomicroscopes or the Axio Imager range of upright microscopes.
Motorised polarisation components on the microscope optimise automatic differentiation
between reflecting and non-reflecting particles.
Both microscope ranges include both a manual and a fully motorised version.
Existing microscope systems can be retrofitted into a particle analyzer on request.