LOT-Oriel
are proud to announce a free two week evaluation of the J A Woollam Alpha-SE
Spectroscopic Ellipsometer.
The new generation Alpha SE JA Woollam line of ellipsometers now comes
with FOUR angles of incidence for modelling complex layered samples & also
an optional liquid cell.
This ellipsometer makes SE measurements fast and simple.
The Alpha-SE will measure both thickness and refractive index with the
use of CompleteEASE : the most powerful analysis ellipsometry software
currently on the market.
With the compact, fully integrated design and USB connection make the ultimate
table top tool, at an affordable price.
Offer applicable in UK/Ireland only
* Subject to availability of instrument