Site Sponsors
  • Oxford Instruments Nanoanalysis - X-Max Large Area Analytical EDS SDD
  • Park Systems - Manufacturer of a complete range of AFM solutions
  • Strem Chemicals - Nanomaterials for R&D
Posted in | Nanoanalysis | Nanobusiness

LOT-Oriel Offers Free Two Week Evaluation of J.A. Woollam Alpha-SE Spectroscopic Ellipsometer

Published on January 18, 2010 at 8:25 PM

LOT-Oriel are proud to announce a free two week evaluation of the J A Woollam Alpha-SE Spectroscopic Ellipsometer.

The new generation Alpha SE JA Woollam line of ellipsometers now comes with FOUR angles of incidence for modelling complex layered samples & also an optional liquid cell.

This ellipsometer makes SE measurements fast and simple.

The Alpha-SE will measure both thickness and refractive index with the use of CompleteEASE : the most powerful analysis ellipsometry software currently on the market.

With the compact, fully integrated design and USB connection make the ultimate table top tool, at an affordable price.

Offer applicable in UK/Ireland only

* Subject to availability of instrument

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Submit