Posted in | Nanoanalysis | Nanobusiness

LOT-Oriel Announces Availability of New J A Woollam T-Solar Ellipsometer

Published on February 23, 2010 at 7:22 AM

LOT-Oriel proudly announces the availability of NEW J A Woollam T-Solar™ Ellipsometer - optimised to measure the widest range of Photovoltaic Thin Films.

The T-Solar™ ellipsometer combines the best photovoltaic measurement technology into a single system designed specifically for textured samples.

Based on the established M-2000® rotating compensator spectroscopic ellipsometer, T-Solar measures hundreds of wavelength across the UV-Visible-NIR.

To improve performance on rough, textured surfaces that significantly reduce reflected signal, T-Solar combines a special High-Intensity Lamp source with our new Intensity-Optimizer.

T-Solar is perfect for characterizing AR coatings on etched silicon surfaces. In addition, it features an adjustable tilt-rotation-stage*, which is required to align the pyramid structures of alkaline-etched monocrystalline surfaces.

PV Applications:

  • Textured Mono- and Multicrystalline Substrates
  • AR Coatings (SiNx, AlNx...)
  • Transparent Conductive Oxides
    • ITO
    • ZnOx
    • doped SnO2
    • AZO
  • a-Si, µc-Si, poly-Si
  • CdTe, CdS, CIGS
  • Organic PV Materials
  • Dye Sensitized Films

For more information please go to http://www.lot-oriel.com/ or contact Heath Young on 01372 378822, e-mail heath@lotoriel.co.uk.

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Submit