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Oxford Instruments Launches Next Generation SDD Technology

Published on August 4, 2010 at 6:36 AM

The X-Max range of large area silicon drift detectors has been leading the market for over 2 years. Now, Oxford Instruments has launched the next generation, offering unrivalled resolution down to 124eV Mn and 48eV C.

Oxford Instruments’ heritage of using innovation to turn smart science into world-class products continues to push the boundaries of silicon drift technology. The new X-Max means that the biggest has just got even better.

The performance of the new X-Max has been upgraded to offer the best combination of size, speed and resolution available. It gives ten times the solid angle of conventional EDS detectors, offering count rate, imaging and premium analytical performance all at the same time.

Click here for more information on X-Max large area silicon drift detector

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