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Study Reveals Superconducting Materials Exhibit Unique Properties at Nanoscale

University of Arkansas researchers have discovered that nanoscale superconductors and associated materials retain their original properties even when developed under strain as atomically thin layers, which is essential to obtain synthetically created superconductive materials at room temperature.

It will enable the scientists to develop new kinds of materials with unique characteristics and allow unusual electronic phases in films at the nanoscale.

Until now, scientists have been convinced that unusual nanoscale electronic or superconducting materials behave in the same manner like their larger size counterparts under strain. However, Jak Chakhalian and his team proved that these earlier beliefs were incorrect. They have conducted research on ultra-thin films with a thickness of few atomic layers at the synchrotron at Argonne National Laboratory.

During the study it was discovered that by using extremely thin films of high-temperature superconductors and similar related electron oxides, nanofilms can be perfectly matched with substrates without showing any obvious stretching or compressing of the materials, Chakhalian said. It cannot be assumed that nature acts identically with various materials, he added.

Moreover, Drexel University theorist, James Rondinelli carried out a complicated super-computer based study to detect the cause behind the retention of atomic shape and distinctive properties by materials under strain. What he observed was the materials’ chemical bonds prefer to rotate rather than compressing or stretching to contain the strain.

Due to extreme repulsion between electrons in high-temperature superconducting materials and associated materials, they prefer to rotate, since it requires lesser energy when compared to stretching or compressing. These findings revealed that strain accommodation at the atomic level results in radically different characteristics based on the strain direction. Chakhalian stated that these newly detected properties are the basis for future-generation ultra-thin film technology with innovative capabilities.

Source: http://www.uark.edu

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