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Posted in | Nanobusiness

Oxford Instruments' New Large Area Silicon Drift Detector for SEM Exceeds Expectations

Published on January 30, 2009 at 8:13 AM

Customers looking for improved productivity and increased accuracy have realised that size really does matter! Orders for Oxford Instruments' new large area silicon drift detector for the SEM have exceeded expectations, and smashed previous records for new product launches.

It seems that customers, new and old, want to benefit from this new detector technology with the 20mm2, 50mm2, and 80mm2 all selling well. Customers who have already taken delivery of their X-Max detector are delighted with the results. Oxford Instruments’ reputation for delivering quality products is proven once again.

FeF Chemicals A/S in Copenhagen, Denmark is one of the first companies to receive their new X-Max 20 detector. They are very pleased with the results they have achieved so far, with their company spokesperson saying "We are very happy with our new investment in an X-Max detector. The system has only been installed for 2 weeks, but already we are very satisfied with the fast analysis times and increased productivity the detector offers. We are working with a lot of different samples including biological materials and we look forward to exploring the possibilities of analysis on beam sensitive samples with X-Max. We expect that this detector will be a real workhorse in the future."

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