NANOLANE is specialized in optical solutions at nanoscale and commercializes characterization tools based on the label-free patented SEEC (Surface Enhanced Ellipsometry Contrast) optical technique...
News - 17 Sep 2013
Nanolane offers its new generation of Sarfus Mapping stations, label-free analytical instruments for real-time sample characterization at nanoscale (down to 0.1nm or 1ng/cm²).
News - 11 Sep 2012
A Chalmers University (Sweden) research group lead by Fredrik Höök has applied Surface-Enhanced Ellipsometric Contrast (SEEC) microscopy for time-resolved, label-free visualization of biomolecular...
News - 19 Jun 2012
presents a study, recently published in PNAS, that deals with the role
of bacterium-generated slime (extracellular mucus forming films of 0.1
to 5nm in thickness) on bacterial adhesion and...
News - 22 Feb 2012
Nanolane of France, a specialist in the development and commercialisation of optical solutions for characterising nanomaterial systems, has launched Sarfus Mapping Lite - an innovative measurement...
News - 19 Jul 2011
Nanolane, the French company that markets truly revolutionary microscope slides with the astounding property to make conventional optical microscopes capable of imaging nano-objects is proud to...
News - 5 Jul 2011
Nanolane has recently installed a complete SARFUS 3D mapping system at ENSSAT, a French institute of technology located in Lannion, France.
This equipment will be used for optics and...
News - 6 Sep 2010
Nanolane is proud to announce the launch of its new equipment SARFUS 3D-IMM dedicated to the topographic characterization of nanometric samples in water.
Equipments for characterization in water are...
News - 18 May 2010
Nanolane will be present as exhibitor and speaker at the next International
Conference on Organized Molecular Films at Quebec City, Canada (July 18-21,
LB13 is an international conference...
News - 24 Mar 2009
In the framework of its total quality policy, NANOLANE has joined as French
member the international experts group WG1PG8 ‘Terminology for nanoscale
measurement and instrumentation' headed by Dr...