Home
Home
Articles
News
Directory
Equipment
Experts
Classifieds
Books
News
Atomic Force Microscopes
Bionanotechnology
Carbon Nanotubes
Control Systems
Data Loggers
Dendrimers
Fullerenes
Graphene
Lab on a Chip
MEMS - NEMS
Microscopy
Nanoanalysis
Nanobusiness
Nanoelectronics
Nanoenergy
Nanoethics
Nanofabrication
Nanofluidics
Nanoindentation
Nanolithography
Nanomagnetics
Nanomaterials
Nanomedicine
Nanooptics and Nanophotonics
Nanoregulations
Nanosensors
Nanotoxicology
Quantum Dots
Articles
Latest Articles
Thought Leaders
Commercializing Nanotechnology
AZojono - Journal of Nanotechnology
Global Market Reports
Materials
Suppliers A to Z
Applications
Industries
Equipment
Aerosol Coating Equipment
AFM Tips, Probes, Cantilevers
Atom Probes
Atomic Emission Spectrometers
Atomic Force Microscopes (AFM)
Atomic Layer Deposition (ALD) Systems
Biomedical Atomic Force Microscopes (bio-AFM)
Calorimeters
Carrier Concentration Profiler
Control Systems
Cryogenic Probe Stations
Data Loggers
Dynamic Light Scattering Instruments
Electrical Conductivity Measurement Systems
Electron Backscattered Diffraction (EBSD) Systems
Ellipsometers
Energy Dispersive X-Ray Spectroscopy (EDS)
Flow Chemistry Reactors
Focused Ion Beam (FIB) Accessories
Focused Ion Beam (FIB) Systems
FT-IR and FT-NIR Spectrometers
Helium Ion Beam Microscopes (HIM)
Induction Heating
Micro Hardness Testers
Microfluidic Devices
Micropositioning Systems
Mills for Reducing Particle Size
Moisture Analyzers
Nanofiber Production Equipment
Nanoimprint Lithography Equipment
Nanoimprint Lithography Templates
Nanoindentation Testers
Nanolithography Systems
Nanoparticle Characterization Systems
Nanoparticle Production Systems
Nanopositioning Systems
Optical Characterization Systems
Optical Tweezers
Particle Size Analyzers
Photoluminescence Mapper
Piezo Actuators
Plasma Cleaning Systems
Plasma Etching Systems
Profilometers
Raman Spectrometers
Sample Preparation Equipment
Scanning Electron Microscope (SEM) Accessories
Scanning Electron Microscopes (SEM)
Scanning Near-Field Optical Microscopes (SNOM)
Scanning Probe Microscopes (SPM)
Scratch Testers
Separation Membranes
Spectrofluorometers
Spectrometers
Spectrophotometers
Spectroscopic Ellipsometers
Sputtering Systems
Streak Cameras
Surface Area Analyzers
TEM Sample Holders and Supplies
Thermal Analysis Equipment
Thermal Desorption Equipment
Thin Film and Coating Thickness Measurement Tools
Thin-Film Deposition Systems
Time Delay Inegration (TDI) Cameras
Transmission Electron Microscopes
Tribometers - Friction and Wear Testers
Ultrasonic Processing Equipment
Vibration Isolation Systems
Wafer Bonders
X-Ray Cameras
X-Ray Diffractometers
X-Ray Fluorescence Analyzers
Zeta Potential Analyzers
Classifieds
Books
Bionanotechnology
Carbon Nanotubes
Dendrimers
Fullerenes
MEMS - NEMS
Microscopy
Nanodevices
Nanoelectronics
Nanoenergy
Nanolithography
Nanomaterials
Nanomedicine
Nanotechnology
Nanotoxicology
Quantum Dots
Journals
Nanoelectronics
Nanoethics
Nanofabrication and Processing Technologies
Nanofluidics
Nanomagnetics
Nanomaterials
Nanomedicine
Nanooptics
Nanosensors
Nanotechnology
Quantum Physics
Spectroscopy
Videos
Atomic Force Microscopes
Graphene
ICONN 2010 Interviews
Lab on a Chip
Microfluidics - Devices and Systems
MRS 2008 Fall Meeting Video Interviews
MRS 2010 Fall Meeting Video Interviews
MRS 2011 Fall Meeting Video Interviews
MRS 2012 Fall Meeting Video Interviews
Nanoanalysis
NanoArt
Nanomanipulation
Nanomaterials
Nanooptics and Nanophotonics
Nanosensors
Nanotechnology and the Environment
Nanotechnology Applications
Nanotechnology in Aerospace
Nanotechnology in Energy
Nanotechnology in Medicine
Nanotechnology in Semiconductors
Nanotechnology Overviews
Nanotubes
Pittcon 2009 Video Interviews
Pittcon 2012 Interviews
Self Assembly
X-Ray Diffraction
Courses
Courses
Events
About
Contact
Meet the Team
Help/FAQs
Terms
Search
Advertise
May 20, 2013
Browse by:
Materials
|
Applications
|
Industries
About
Advertise
Terms
Site Sponsors
Latest Nano News
Cambrios to Present on Silver Nanowire-Based Transparent Conductive Coating Material at Display Week 2013
Carbon Nanotube-Coated Carbon Fiber Composites for Next Generation of Airplanes
Defects Discovered in Nanoscale Coherent Twin Boundaries
Multitasking Neurons Improve Computational Power of the Brain
Dolomite to Productize Drop-Tech’s Innovative Microfluidic Device
Site Sponsors
Search
Request for Quote (RFQ): If you'd like us to help you source a Quotation for any particular products or from any suppliers, please
click here
. Once submitted, we will try and place you in contact with a suitable supplier within 48 hours.
Videos
Experts
Journals
Courses
Events
Classifieds
Search is Loading...
All
News
Articles
Suppliers
Equipment
Books
More
Results
1
-
10
of
193
for
Tomography
.
Search
Next>
Breaking Barriers of Routine Scanning Probe Microscopy and the Stability of SPM Experiments Using NTEGRA Heads from NT-MDT
This article examines the use of various NTEGRA products from NT-MDT for overcoming the short comings or failures of straight scanning probe microscopy
http://www.azonano.com/article.aspx?ArticleID=2048
|
21 Jan 2008
Highest Resolution Transmission Electron Microscope In The World the Tecnai G² F30 U-TWIN from FEI Company
Tecnai G² 300 kV TEM (transmission electron microscope) systems from FEI Company can investigate thicker samples than 200 kV systems, as a higher acceleration voltage can be used. The 300 kV U-TWIN...
http://www.azonano.com/article.aspx?ArticleID=1182
|
14 Apr 2005
Field Emission Transmission Electron Microscope For Use In All Laboratory Types the Tecnai G² F20 S-TWIN from FEI Company
The Tecnai 200 kV field emission TEM (transmission electron microscope) from FEI Company is a workhorse microscope for multi-user laboratories of any type.
http://www.azonano.com/article.aspx?ArticleID=1181
|
14 Apr 2005
Transmission Electron Microscopy For Biology and Biological Process Research Using the Tecnai G² Spirit (Bio)TWIN from FEI Company
Transmission electron microcopy (TEM) is of paramount importance to obtain high magnification and high resolution information. The Tecnai G² Spirit builds on more than 50 years experience in Life...
http://www.azonano.com/article.aspx?ArticleID=1170
|
11 Apr 2005
Researchers Assess the Evolution of Quantum Dot Imaging and Reveal its Potential in Cancer Diagnosis
A mixed discipline research team from UCLA and Stanford University has released its findings on how using the nanocrystals known as quantum dots (qdots) in molecular medical imaging can help us better...
http://www.azonano.com/article.aspx?ArticleID=1132
|
4 Mar 2005
Tomography Software For Tecnai Microscopes, Xplore 3D Version 2. The Intelligent Electron Tomography Package – Supplier Data By FEI Company
Xplore3D offers the complete solution for Tecnai microscopes, enabling a new level of accuracy, reliability and convenience in 3D tomography. It guides users through the whole process of tomography:...
http://www.azonano.com/article.aspx?ArticleID=1195
|
15 Apr 2005
New Tomography Solution for TEM Users from JEOL USA
JEOL USA is pleased to offer the latest tomography solutions for transmission electron microscopy (TEM). Tomography, or three-dimensional (3D) reconstruction of multiple TEM images, has...
http://www.azonano.com/news.aspx?newsID=9706
|
3 Feb 2009
New Nanoscale X-Ray Computed Tomography Method to Understand Earth's Inner History
To answer the big questions, it often helps to look at the smallest details. That is the approach Stanford mineral physicist Wendy Mao is taking to understanding a major event in Earth's inner...
http://www.azonano.com/news.aspx?newsID=20980
|
17 Dec 2010
Nano-Tomography to Produce 3D Detailed Imaging of Fragile Bone Structures
Scientists working in Germany and Switzerland have developed a novel nano-tomography method, which uses X-rays to allow doctors to produce three-dimensional (3D) detailed imaging of fragile...
http://www.azonano.com/news.aspx?newsID=19986
|
13 Oct 2010
Digisens Introduces New-Generation Electron Tomography Software for Nanotechnology Researchers
More than only cross-correlation to align a raw tilt-series without fiducials, 3D reconstruction with iterative algorithms (SART, SIRT, OS-SART) using multi-GPUs, intuitive 3D/2D...
http://www.azonano.com/news.aspx?newsID=19926
|
11 Oct 2010
Result Page
1
2
3
4
5
6
7
8
9
10
Next