JG&A Metrology Center is a specialized lab focused on providing 3D internal part inspection services using Industrial CT Equipment.
By utilizing our non-destructive Industrial CT (Computed...
The companies under Bruker Inc. are globally leading manufacturer of analytical systems for life and materials sciences. The Bruker Nano Analytics (BNA) Division, headquartered at Bruker Nano GmbH in...
The NanoTech User Facility (NTUF) houses leading-edge instruments for characterization
and fabrication at the micro- and nanoscales. Imaging tools include a field-emission
Micro Photonics is the leading source of advanced instrumentation for scientific and industrial research. Thousands of clients rely on us for innovative solutions, technically superior products,...
Xradia develops technology to help advance innovation in science and industry by providing unique insight through superior X-ray imaging solutions. Xradia products utilize advanced X-ray computed...
BaySpec, Inc., founded in 1999 with 100% manufacturing in the USA (San Jose, California), is a vertically integrated spectral sensing company. The company designs, manufactures and markets advanced...
The Fabricated Products (FPR) business segment of H.C. Starck converts technology metal powders: molybdenum (Mo), niobium (Nb), tantalum (Ta) and tungsten (W) into customer-specific semi-finished and...
This article examines the use of various NTEGRA products from NT-MDT for overcoming the short comings or failures of straight scanning probe microscopy
http://www.azonano.com/article.aspx?ArticleID=2048 | 21 Jan 2008
Tecnai G² 300 kV TEM (transmission electron microscope) systems from FEI Company can investigate thicker samples than 200 kV systems, as a higher acceleration voltage can be used. The 300 kV U-TWIN...
http://www.azonano.com/article.aspx?ArticleID=1182 | 14 Apr 2005
The Tecnai 200 kV field emission TEM (transmission electron microscope) from FEI Company is a workhorse microscope for multi-user laboratories of any type.
http://www.azonano.com/article.aspx?ArticleID=1181 | 14 Apr 2005