JEOL has created a unique wavelength dispersive spectrometer (WDS) that uses a variable space grating to efficiently and in parallel gather very low-energy rays (known as “soft” X-rays).
The new Soft X-ray Emission Spectrometers (SXES) have high spectral resolution (0.3 eV), allowing for resolution of the Nitrogen Kα and Titanium Lℓ lines with a separation of only 1.78 eV. The spectrometer also offers ultra-low energy and low concentration sensitivity, enabling the detection of lithium at low single-digit weight percent levels.
Another—and perhaps its greatest—advantage is its capacity to perform chemical state analysis. The spectrometer distinguishes between bonding and crystal structure in samples that contain the same elements by detecting changes between conduction band and valence band electrons when they emit X-rays. An example would be differentiating highly organized pyrolytic graphite vs. diamond vs. amorphous C, all made exclusively of carbon.
JEOL has also introduced a new Soft X-ray Emission Spectrometer with an extended energy range (SXES-ER). The SXES-ER has a spectral range of 100 eV to about 2300 eV. This increased range enables the collection of light elements, as well as transition metals and heavy elements via the L, M, and N lines.
The SXES is compatible with JEOL FE-SEMs and JEOL W/LaB6/FEG EPMA systems.
Li Detection: Peak shape in Compounds
A solitary K-line was discovered in metallic Li. Depending on their valence band occupancy, an extra satellite peak may appear in Li compounds.
High Energy Resolution Spectral Mapping
The SXES provides for the first direct observation of the Li-K emission. It can even map the many chemical states of a Li-battery caused by varying battery charge amounts. Two distinct Li-K emission lines can be mapped. The intensity of the lower energy Li-K line corresponds to the battery’s charge level, while the higher energy Li-K line corresponds to the amount of metallically bonded Li.
Fast Parallel Detection
Thanks to a high-sensitivity X-ray CCD and a recently designed aberration-corrected grating device, the SXES can simultaneously gather a spectrum over a broad energy range.
Chemical State Analysis
SXES chemical state analysis is equivalent to XPS or EELS. The SXES has an energy resolution of 0.3 eV, as shown by the Fermi-edge of the Al-L emission of Al metal.
Key Features
SXES
- Extreme spectral resolution 0.3 eV Al-L fermi edge
- There are no moving parts, which leads to exceptional stability and reproducibility
- Part of an integrated analytical system or as a stand-alone detector
- Easy-to-use spectral mapping
- Outstanding detection of light elements (suitable for Li)
- Perfect for light element chemical state study, which is essential for battery research
- Excellent sensitivity: a few tens of ppm B in steel
- Energy range: 50 eV–210 eV (even second and third order lines have a strong P/B ratio and resolution)
SXES-ER
- Exceptional light element detection (B-S, first order)
- Detects first-order K lines (N-S), L lines (Ca-Mo), and M lines (Cd-Bi)
- Trace element – chemical state analysis of Be-N
- Ultrahigh spectral resolution (Zr-M z 1.2 eV FWHM JS300N / Fe-L α 5.0 eV FWHM JS200N)
- There are no moving parts, making it very stable and reproducible
- Part of an integrated analytical system or as a stand-alone detector
- Using spectral mapping is easy