Posted in | Nanomaterials | Nanoanalysis

Malvern's Head of Product Management to Speak at Conference on Nanotechnology and the Coatings Industry

Ciaran Murphy, Head of Product Management at Malvern Panalytical, will review the benefits and limitations of common nanoparticle sizing technologies in a presentation at Nanotechnology & the Coatings Industry 2013.

This one-day conference, organized by NanoKTN, PRA (Paints Research Association) and BCF (British Coatings Federation), takes place on 8 October 2013 at the Nottingham Belfry (UK). Mr Murphy will be one of a line up of conference speakers that includes specialists drawn from both industry and academia. Malvern Panalytical will also be exhibiting the Zetasizer Nano ZSP, the newest addition to the company’s Zetasizer family of nanoparticle characterization systems which are widely used across the paints and coatings industry.

Ciaran Murphy, Head of Product Management at Malvern Panalytical will speak at Nanotechnology and the Coatings Industry 2013.

In his presentation "Nanoparticle sizing - Think of a number", Ciaran Murphy will review some of the more common sizing technologies indicating their capabilities and limitations in the light of the changing regulatory landscape. Nanotechnology-based products can provide superior performance attributes, and the size and size distribution of nanoparticles in a coating formulation has a large influence on its functional characteristics. (Nano) sizing characterization in general is drawing increasing interest from manufacturers and regulators with the former concerned about achieving the desired performance at appropriate cost and the latter concerned about toxicological impacts.

The Malvern Panalytical Zetasizer series measures particle and molecule size from below a nanometer to several microns using dynamic light scattering, zeta potential and electrophoretic mobility using electrophoretic light scattering, and molecular weight using static light scattering. In addition the system can be connected to a GPC / SEC system to use as a chromatography detector. The system is available in a range of variants that enables selection of the best system for each specific application and budget.

Registration details for the event can be found online at http://bit.ly/NCI13REG

For more information on Malvern Panalytical’s solutions for nanoparticle characterization please go to www.malvern.com/nano

About Malvern Panalytical

Malvern Panalytical provides the materials and biophysical characterization technology and expertise that enables scientists and engineers to understand and control the properties of dispersed systems. These systems range from proteins and polymers in solution, particle and nanoparticle suspensions and emulsions, through to sprays and aerosols, industrial bulk powders and high concentration slurries. Used at all stages of research, development and manufacturing, Malvern Panalytical’s materials characterization instruments provide critical information that helps accelerate research and product development, enhance and maintain product quality and optimize process efficiency.

Our products reflect Malvern Panalytical’s drive to exploit the latest technological innovations and our commitment to maximizing the potential of established techniques. They are used by both industry and academia, in sectors ranging from pharmaceuticals and biopharmaceuticals to bulk chemicals, cement, plastics and polymers, energy and the environment.

Malvern Panalytical systems are used to measure particle size, particle shape, zeta potential, protein charge, molecular weight, mass, size and conformation, rheological properties and for chemical identification, advancing the understanding of dispersed systems across many different industries and applications.

Headquartered in Malvern Panalytical, UK, Malvern Panalytical has subsidiary organizations in all major European markets, North America, China, Japan and Korea, a joint venture in India, a global distributor network and applications laboratories around the world. www.malvern.com

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