Bruker today announced the release of the large-sample Dimension IconIR™ nanoscale infrared spectroscopy and chemical imaging system. It combines Bruker’s industry-leading Dimension Icon® AFM and nanoIR™ photothermal AFM-IR technology to establish new standards in chemical and material property mapping with sub-10 nm chemical imaging resolution.
Incorporating Bruker’s exclusive PeakForce Tapping® mode, the new large-sample platform uniquely delivers the most complete correlative microscopy solution for quantitative nanochemical, nanomechanical, and nanoelectrical characterization. Ultimately, IconIR provides radically more flexibility and applicability to enable groundbreaking research across a broad range of polymer, geoscience, semiconductor, and life science applications.
“For the first time, IconIR enables me to combine nanoIR spectroscopy and sub-10 nm chemical imaging resolution with advanced quantitative property mapping techniques,” stated Dr. Alexandre Dazzi, Professor at the University of Paris-Saclay, and inventor of the AFM-IR technique that enables Bruker’s nanoIR. "With these new capabilities, I will be able to easily discriminate the polymer composition in a blend with a resolution of a few nanometers. In addition, the Tapping AFM-IR mode is so sensitive and robust that we can now study complex systems with strong mechanical heterogeneities.”
“This new platform extends nanoIR technology into new application segments not currently addressed by the AFM-IR technique, enabling users to undertake more detailed studies to better understand the structure and composition of materials,” added Dean Dawson, Bruker’s Sr. Director and Business Manager for nanoIR Products. “Building upon our highly respected AFM-IR technology, the Dimension IconIR system significantly extends nanoscale characterization with correlative capabilities for the most advanced academic and industrial research and improves chemical imaging resolution well beyond 10 nm.”
About Dimension IconIR
Dimension IconIR is a combined nanoscale IR spectroscopy and scanning probe microscope (SPM) system that incorporates decades of research and technological innovation to deliver the utmost performance, functionality, and capability in nanoscale infrared spectroscopy and imaging with unrivalled nanoscale property mapping capabilities. In a single system, IconIR provides the highest performance for nanoscale infrared spectroscopy, chemical imaging resolution, and monolayer sensitivity. It builds upon the Dimension Icon, which is the world’s most used large-sample AFM platform, providing ultimate sample flexibility while retaining the measurement performance and capabilities of the Icon AFM. The standard system supports samples up to 150 mm, with versions for larger samples also available. Bruker’s patented suite of Photothermal based AFM-IR spectroscopy modes is the most comprehensive available, with hundreds of publications demonstrating its success as the world’s leading nanoIR technology. Customer publications have continually demonstrated the highest performance spectra and chemical imaging resolution with correlation to FTIR techniques. IconIR also utilizes the full range of Bruker’s Dimension platform accessories and SPM modes to make it the most advanced correlative nanoscale characterization system available for materials research.