Oxford Instruments Asylum Research today announces the release of its new nanoscale time-dependent dielectric breakdown (nanoTDDB) high voltage accessory for the Jupiter XR atomic force microscope (AFM). The NanoTDDB technique measures the voltage at which a material undergoes dielectric breakdown. This unique nanoTDDB accessory expands the range of electrical characterization tools available on Jupiter XR, allowing for advanced measurements in the fields of semiconductors, 2D materials, thin films and polymers.
“The nanoTDDB accessory can measure breakdown voltages up to ±150 V on both small and large samples, such as 200 mm wafers. It’s a great addition to the suite of accessories for the Jupiter XR AFM,” commented Dr. Jason Li, Product Science Group Manager at Oxford Instruments Asylum Research.
Asylum Research AFMs are widely used across many different industrial and academic research fields, including energy storage, polymers, semiconductors and 2D materials. The Jupiter XR is a large-sample AFM that can accommodate samples up to 200 millimeters in diameter and inspect areas up to 100×100 microns while still delivering ultra-high resolution and high throughput, with typical images taking less than 60 seconds to acquire.