Rigaku Americas Corporation announced the introduction of the Ultima IV X-ray diffractometer, an advanced general purpose X-ray diffraction (XRD) instrument for materials science, semiconductor, and nanotechnology research and development as well as quality assurance for the manufacturing environment. The design features a new high speed detector for 100X faster measurements, unrivaled application flexibility provided by patented Cross Beam Optics (CBO), and a 50% smaller size than a conventional XRD system.
Innovative by design, a fully optioned Rigaku Ultima IV can span applications that would have required up to four separate conventional XRD instruments in the past. A modular 'build-up' platform allows users to add additional capabilities as a new application requirements arise, including support for high resolution diffraction, thin film measurement, micro diffraction, and handling very small samples.
The Ultima IV is equipped with a unique and patented (US 6,807,251) Cross Beam Optics (CBO) mechanism that allows user selectable switching between either a focusing or parallel incident X-ray beam without resetting or realigning the optical system. Both system geometries are permanently mounted and permanently aligned to allow easy changeover for different applications. All other competitive x-ray diffraction systems require system reconfiguration when switching operation of the system between focusing and parallel beam geometries. In addition, new optics for micro diffraction provides data quality close to that provided by a dedicated microdiffraction system.
The new Ultima IV is also must more efficient that a conventional XRD instrument, occupying 50% less space and having 20% less mass. A reduce footprint means lower facilities overhead for a reduced cost-of-ownership (COO). In addition, the sample stage height is 300 mm lower than a conventional XRD system for ease-of-use. Ultima IV measures: 1100 mm W x 810 mm D x 1630 mm H.