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Results 1 - 10 of 344 for AFMs
  • Supplier Profile
    Asylum Research is the technology leader in atomic force probe microscopy (AFM) for both materials and bioscience applications.  Founded in 1999, we are dedicated to innovative...
  • Supplier Profile
    Park Systems Corporation is the world’s leading manufacturer of atomic force microscopy systems for scientific research, nanoscale engineering, semiconductor fabrication and quality assurance....
  • Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
  • Supplier Profile
    Atomic Force Microscopes (AFMs) are versatile instruments that interact with surfaces at the nanometer scale. By "feeling" a sample using a very sharp needle, not unlike the way a record...
  • Supplier Profile
    Nanotechnology is our field. Precision is our tradition. Innovation is our key instrument. That's why we are located in Switzerland, one of the most powerful and innovative areas in...
  • Supplier Profile
    The mission of AFM Workshop is to develop and market innovative AFM products and components for research, development, OEMs and education. They support their customers with workshops on the...
  • Article - 10 Dec 2019
    This article discusses how 2D materials can be characterized using AFM.
  • Supplier Profile
    Nanosurf: Zoom into the future Nanosurf is a company that thrives on challenges at the frontier of what is physically achievable. By concentrating our collective efforts on the obstacles that stand...
  • Supplier Profile
    More than 25 years ago, the foundations of Park Systems were laid at Stanford University, where Dr. Sang-il Park, the founder of Park Systems, worked at Prof. Quate’s group that invented the...
  • News - 17 Oct 2017
    Bruker has released the NanoMechanics Lab™, a suite of force-mapping modes that enable Dimension FastScan® and Icon® AFM systems to perform quantitative nanoscale characterization,...
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