Atomic Force Microscopes (AFMs) are versatile instruments that interact with surfaces at the nanometer scale. By "feeling" a sample using a very sharp needle, not unlike the way a record player works, a very precise 3D reconstruction of the surface can be created.
AFMs have been around since the 1980s and have become indispensable tools for scientists and engineers. ICSPI has improved these conventional instruments by dramatically reducing their size, cost, and complexity. We integrated all of the active components of an AFM onto a silicon microchip. The sharp needle can be positioned with three degrees of freedom by a tiny moving machine, or MEMS device, with built-in sensors. The MEMS device is made in the same reliable CMOS process as virtually all computer chips.
The Single-Chip Atomic Force Microscope
Siyu Chen, Ph.D.
In this interview, we discuss a new approach to surface-enhanced Raman spectroscopy that utilizes nano-pockets to capture target molecules, ensuring a highly sensitive way to detect chemical processes.
Dr. Yitong Dong
Dr. Yitong Dong has recently been awarded funding to study custom composite nanocrystals, which could help to create advanced quantum communication technologies. Learn more about this project in this interview.
Roey Elnathan, Ph.D.
We take a closer look at the fusion of nanotechnology and CAR-T therapy through our interview with Dr. Roey Elnathan about a new approach that harnesses the capabilities of nanoneedles to efficiently deliver genetic materials to target cells.
The Verifire™ interferometer system provides fast and reliable measurements of surface form error.
This article outlines how Unity, Oxford Instruments’ new detector for a revolutionary new imaging technique, can be used to revolutionize imaging.
Discover the compact, fast rotary table V-610 for precision testing and manufacture.