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Results 1 - 10 of 309 for AFMs
  • Asylum Research - An Oxford Instruments Company
    Supplier Profile
    Asylum Research is the technology leader in atomic force probe microscopy (AFM) for both materials and bioscience applications.  Founded in 1999, we are dedicated to innovative...
  • Bruker Nano Surfaces and Metrology
    Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
  • ICSPI (Integrated Circuit Scanning Probe Instruments)
    Supplier Profile
    Atomic Force Microscopes (AFMs) are versatile instruments that interact with surfaces at the nanometer scale. By "feeling" a sample using a very sharp needle, not unlike the way a record...
  • Nanoworld AG
    Supplier Profile
    Nanotechnology is our field. Precision is our tradition. Innovation is our key instrument. That's why we are located in Switzerland, one of the most powerful and innovative areas in Europe. Using...
  • AFM Workshop
    Supplier Profile
    The mission of AFM Workshop is to develop and market innovative AFM products and components for research, development, OEMs and education. They support their customers with workshops on the...
  • Applications of AFM in the Characterization of 2D Materials
    Article - 10 Dec 2019
    This article discusses how 2D materials can be characterized using AFM.
  • Nanosurf AG
    Supplier Profile
    Nanosurf: Zoom into the future Nanosurf is a company that thrives on challenges at the frontier of what is physically achievable. By concentrating our collective efforts on the obstacles that stand...
  • Bruker Introduces NanoMechanics Lab for Dimension AFMs
    News - 17 Oct 2017
    Bruker has released the NanoMechanics Lab™, a suite of force-mapping modes that enable Dimension FastScan® and Icon® AFM systems to perform quantitative nanoscale characterization,...
  • Bruker Introduces Scanning Microwave Impedance Microscopy for Dimension Icon AFMs
    News - 18 May 2016
    PeakForce sMIM Mode Provides Enhanced Nanoscale Mapping of Permittivity and Conductivity Bruker’s Nano Surfaces Division today announced the release of scanning microwave impedance microscopy...
  • Asylum Research AFMs Guide Thin Film Process Development
    News - 3 Sep 2015
    Thin films are ubiquitous in materials science and technology, with uses ranging from exotic next generation materials (e.g. ferroelectric data storage) to practical everyday  items (e.g. food...

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