Article - 9 May 2008
Conductive AFM can simultaneously map the topography and current distribution of a sample. It is a measurement useful in a wide variety of material characterization applications including thin...
News - 18 Dec 2014
Researchers at Oak Ridge National Laboratory (ORNL) have successfully carved out nanoscale designs on polymer surfaces using atomic force microscopy (AFM).
The nanofabrication was performed on a...
News - 1 Oct 2013
Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997, announced PinPoint Conductive AFM, an extremely accurate conductive measurement technology at nano-scale resolution...
Article - 18 Apr 2011
Nanostructures form the web on which a number of electronic devices are built. Therefore, it is important to analyse and study their electrical structures. The PeakForce TUNA method allows researchers...
Article - 12 Apr 2011
Organic solar cells has been considered a viable solar energy option due to their light weight, low production costs and flexibility. The barrier to their use is their poor efficiency. The PeakForce...
Asylum Research is the technology leader in atomic force probe microscopy (AFM) for both materials and bioscience applications. Founded in 1999, we are dedicated to innovative instrumentation...
Article - 27 Apr 2005
Scanning Probe Microscopy (SPM) is a powerful tool used to study surfaces and surface properties at nanometre resolution. Different operating modes for Scanning Tunneling Microscopes (STM) and Atomic...
Article - 24 Aug 2005
Scanning Tunneling Microscopes (STMs) were the first type of microscopes that let scientists study material at the atomic level. The history of STMs, how STMs work, operational techniques, the...
Article - 26 May 2005
Scanning Capacitance Microscopes (SCM) and Scanning Probe Microscopes (SPM) can be used to study Metal Oxide Semiconductor (MOS) structures. This article looks at the fabrication of short and long...
Article - 22 Mar 2019
This article discusses the the applications of scanning probe microscopy (SPM).