Search

Search Results
Results 371 - 372 of 372 for Electron Tubes
  • Equipment
    The ground-breaking Photo-induced Force Microscopy (PiFM) mode is integrated into all VistaScope models. The PiFM mode measures the polarizability of the sample with high sensitivity and nanometer...
  • Article - 10 Dec 2004
    There are several different methods of classification for nanomaterials. This article focuses on the categorisation of nanoparticles, fullerenes, dendrimers, nanowires, nanotubes, nanolayers and...