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Results 61 - 70 of 219 for FEI
  • Supplier Profile
    For the last 46 years Kratos Analytical has provided state-of-the-art spectrometers for surface analysis and we are committed to continuing with development of leading technologies. As we approach our...
  • Supplier Profile
    HORIBA, headquartered in the United States, provides an extensive array of instruments and solutions for applications across a broad range of scientific R&D and QC measurements. HORIBA is a world...
  • Supplier Profile
    XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems. XEI...
  • News - 8 Sep 2008
    FEI Company and Imago Scientific Instruments jointly announced today that Chalmers University has installed Imago's LEAP® 3000X HR® atom probe in the university's Applied Physics...
  • News - 5 Jan 2009
    FEI Company (Nasdaq:FEIC), a leading provider of high-resolution imaging and analysis systems, today announced that it had acquired substantially all of the assets of Intellection Holdings Pty. Ltd....
  • Supplier Profile
    Applied Physics Technologies, incorporated in 1995 by William Mackie and Gary Cabe, is an outgrowth of research conducted for over a decade at Linfield Research Institute on transition metal carbides,...
  • Supplier Profile
    Fischione Instruments operates from its 24,000 square foot facility located 25 miles east of the city of Pittsburgh. Fischione utilizes state-of-the-art technology in its applications, engineering,...
  • Supplier Profile
    Agilent is a leader in life sciences, diagnostics and applied markets. The company provides laboratories worldwide with instruments, services, consumables, applications and expertise, enabling...
  • Supplier Profile
    Veeco is a global leader in Process Equipment technology. Our products combine innovative technological solutions with highest capital efficiency to drive our customer’s critical manufacturing...
  • News - 10 Sep 2007
    The highest-resolution images ever seen in (S)TEM electron microscopy have been recorded using a new instrument developed jointly by U.S. Department of Energy national laboratories, FEI Company and...

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