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Results 1 - 10 of 19 for SThM
  • Bruker Nano Surfaces and Metrology
    Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
  • Researchers Measure Thermal Transport Properties of Self-Assembled Monolayers
    News - 18 Nov 2021
    Devices have been shrinking by the day, and new difficulties in their measurement and design present themselves. The electric transport properties of devices based on molecular junctions, where single...
  • Scanning Thermal Microscope Accessory Allows Nanoscale Thermal Imaging
    News - 5 Sep 2007
    Anasys Instruments announce the release of a new Scanning Thermal Microscopy (SThM) accessory that enables a number of commercially available AFMs to generate nanoscale thermal images while...
  • Bruker BioAFM
    Supplier Profile
    Bruker BioAFM, former JPK Instruments AG,  is a lead­ing man­u­fac­tur­er of nano-an­a­lyt­i­cal in­stru­ments - par­tic­u­lar­ly based...
  • Nanosurf AG
    Supplier Profile
    Nanosurf: Zoom into the future Nanosurf is a company that thrives on challenges at the frontier of what is physically achievable. By concentrating our collective efforts on the obstacles that stand...
  • Asylum Research - An Oxford Instruments Company
    Supplier Profile
    Asylum Research is the technology leader in atomic force probe microscopy (AFM) for both materials and bioscience applications.  Founded in 1999, we are dedicated to innovative...
  • Using Nanoscale IR Spectroscopy to Characterize 2D Materials
    Article - 26 Nov 2020
    How Nanoscale IR Spectroscopy can be used to Characterize 2D Materials .
  • Studying Electrical Properties -and More- with AFM
    Article - 6 Feb 2024
    In this article, Bruker details how AFM can be used to study the electrical, thermal and mechanical properties of a wide range of materials and devices.
  • Characterizing 2D Materials with AFM-IR Spectroscopy
    Article - 5 Jun 2017
    The Anasys nanoIR3 AFM-IR spectrometer allows scientists to observe, image and characterize 2D materials at the nanoscale.
  • Introduction to Scanning Thermal Microscopy - Part 3
    Video
    This video presentation covers the basics of scanning thermal microscopy, a scanning probe-based measurement technique for mapping thermal properties of samples. SThM enables the measurement of...

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