Choosing the right instrument or technique to study samples at the nanoscale can be both confusing and challenging.
In this session, Nanosurf AG will explore four common systems used in research labs today for imaging, characterizing, and measuring surfaces at the micro and nanoscale: scanning electron microscopy (SEM), atomic force microscopy (AFM), optical profilometry, and stylus profilometry.
The webinar will detail the optimal use cases for each technique, highlight their limitations, and provide examples of scenarios where one method might be preferred over another, showing why many systems are frequently required to properly comprehend one's sample.
The speaker, Drew J. Griffin, will also examine how AFM serves as a bridge between imaging and metrology at the nanoscale, underscoring its role as a vital instrument in materials science, chemistry, physics, and imaging laboratories.
Speaker: Drew J. Griffin
What is the right instrument for investigating my surface at the nanoscale
Video Credit: Nanosurf AG