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Novel Technique Combining AFM and Mass Spectrometry Allows Simultaneous Chemical, Physical Characterization

Novel Technique Combining AFM and Mass Spectrometry Allows Simultaneous Chemical, Physical Characterization

Anasys Instruments Corp. has licensed a Department of Energy Oak Ridge National Laboratory technology that allows for simultaneous chemical and physical characterization and could lead to advances in materials and drug development. [More]
Researchers Explain Behavior of Electrons at Tiny Step Edges on Titanium Oxide Surfaces

Researchers Explain Behavior of Electrons at Tiny Step Edges on Titanium Oxide Surfaces

It can be found in toothpaste, solar cells, and it is useful for chemical catalysts: titanium dioxide (TiO2) is an extremely versatile material. Alhough it is used for so many different applications, the behaviour of titanium oxide surfaces still surprises. [More]
Novel Reusable Probe for AFM Enables Precision and Stability in Picoscale Force Measurements

Novel Reusable Probe for AFM Enables Precision and Stability in Picoscale Force Measurements

JILA researchers have engineered a short, flexible, reusable probe for the atomic force microscope (AFM) that enables state-of-the-art precision and stability in picoscale force measurements. Shorter, softer and more agile than standard and recently enhanced AFM probes, the JILA tips will benefit nanotechnology and studies of folding and stretching in biomolecules such as proteins and DNA. [More]
Park Systems Introduce Automatic Defect Review for AFM Wafer Inspection

Park Systems Introduce Automatic Defect Review for AFM Wafer Inspection

Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, proudly introduces the Automatic Defect Review (ADR)AFM for 300mm bare wafers, a fully automated AFM solution that improves throughput of AFM defect review by up to 1,000%. [More]
NT-MDT Launches Titanium AFM with Automated Tip Exchange

NT-MDT Launches Titanium AFM with Automated Tip Exchange

NT-MDT, a premier global provider of innovative AFM and SPM, proudly announces Titanium, the first AFM with a self-aligning, multiple probe cartridge for fast, automated tip exchange. [More]
AFM-Based CellHesion System Used to Nurture Multi-Disciplinary Research

AFM-Based CellHesion System Used to Nurture Multi-Disciplinary Research

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the study of the research work of Dr Paul Squires and his colleagues at the University of Warwick. [More]

AFM-IR Inventor Receives Ernst Abbe Memorial Award for Innovation in Imaging and Microscopy

Anasys Instruments is pleased to announce that the inventor of the AFM-IR technique, Professor Alexandre Dazzi from the Université Paris-Sud, is to receive the Ernst Abbe Memorial Award. The award is given by the... [More]
NanoWorld Release Ultra-Short Cantilevers for High-Speed AFM

NanoWorld Release Ultra-Short Cantilevers for High-Speed AFM

NanoWorld AG has announced the official commercialization of six types of Ultra-Short Cantilevers (USC) dedicated for use in High-Speed Atomic Force Microscopy (HS-AFM). [More]
Nanjing University Researcher Uses JPK AFM Instrumentation for Single Molecule Force Spectroscopy

Nanjing University Researcher Uses JPK AFM Instrumentation for Single Molecule Force Spectroscopy

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the study of how force regulates the structures and conformational dynamics of biomacromolecules using AFM-based single molecule force spectroscopy, a project of Professor Yi Cao of Nanjing University. [More]
Asylum Research Offer iPad to Winner of AFM Image Contest

Asylum Research Offer iPad to Winner of AFM Image Contest

Asylum Research, an Oxford Instruments company, invites all Cypher™ and MFP-3D™ AFM users to enter their best AFM data, including images, force curves, or videos, in the Asylum Research Image Contest. [More]
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