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Electricity and Water Help Control Nanoscale Friction on Ionic Surfaces

Electricity and Water Help Control Nanoscale Friction on Ionic Surfaces

Researchers at the Department of Energy’s (DOE) Oak Ridge National Laboratory (ORNL) have discovered a new method to control friction in ionic solids at the nanoscale using ambient water vapor and electrical stimulation. Friction affects motion and hence frictional forces have to be controlled. Traditionally, lubrication or mechanistic means have been used for controlling friction forces. [More]
NT-MDT Installs Unique AFM with RAMAN, TERS, and SNOM Capabilities at University of Limerick

NT-MDT Installs Unique AFM with RAMAN, TERS, and SNOM Capabilities at University of Limerick

The University of Limerick has received one of Europe's most powerful microscopes supported by NT-MDT, a world-leading manufacturer of atomic force based microscopes (AFM). NT-MDT recently installed a unique Atomic Force Microscope with RAMAN, TERS, and SNOM capabilities (NTEGRA Spectra). [More]
Oxford Instruments Asylum Research Announces  AFM Image Contest Winners

Oxford Instruments Asylum Research Announces AFM Image Contest Winners

Oxford Instruments Asylum Research is pleased to announce the winners of its AFM Image Contest. [More]
Atomic Force Microscopy Etches Nanoscale Patterns on Conductive Polymers

Atomic Force Microscopy Etches Nanoscale Patterns on Conductive Polymers

Researchers at Oak Ridge National Laboratory (ORNL) have successfully carved out nanoscale designs on polymer surfaces using atomic force microscopy (AFM). [More]
NIST Sensor May Help Sidestep Problems in Calibrating AFMs

NIST Sensor May Help Sidestep Problems in Calibrating AFMs

Spotting molecule-sized features—common in computer circuits and nanoscale devices—may become both easier and more accurate with a sensor developed at the National Institute of Standards and Technology (NIST). With their new design, NIST scientists may have found a way to sidestep some of the problems in calibrating atomic force microscopes (AFMs). [More]
Bruker Releases BioScope Resolve™ Biological Atomic Force Microscope at Sixth AFM BioMed Conference

Bruker Releases BioScope Resolve™ Biological Atomic Force Microscope at Sixth AFM BioMed Conference

At the Sixth AFM BioMed Conference, Bruker today announced the release of BioScope Resolve™, a biological atomic force microscope (bioAFM) that features the highest resolution imaging and most complete cell mechanics capabilities available for use with an inverted optical microscope (IOM). [More]
Oxford Instruments Launches Innovative Product for SEM-Based Particle Analysis

Oxford Instruments Launches Innovative Product for SEM-Based Particle Analysis

Oxford Instruments, the leading supplier of SEM-based particle analysis systems, has introduced its next generation particle analysis platform, AZtecFeature. [More]
Global Atomic Spectroscopy Market Forecast to Grow at 7.01% CAGR

Global Atomic Spectroscopy Market Forecast to Grow at 7.01% CAGR

Atomic spectroscopy is a technique used to analyze the elemental composition of an analyte by its electromagnetic or mass spectrum. This analysis is conducted with the help of spectral instruments by measuring the radiation intensity as a function of wavelength. The spectral instruments used in atomic spectroscopy are referred to as spectrometers or spectral analyzers. [More]
JPK Study Plant Cells at the University of Queensland using AFM

JPK Study Plant Cells at the University of Queensland using AFM

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the use of AFM and the CellHesion® module to study plant cell wall biology in the School of Chemical Engineering at the University of Queensland. [More]
Park Systems Revolutionizes Atomic Force Microscopy using Automated Imaging Processing

Park Systems Revolutionizes Atomic Force Microscopy using Automated Imaging Processing

Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announced today that they will debut an industry changing AFM auto image scanning mode for their AFM systems at the MRS Fall show in Boston. [More]