Atomic Force Microscopes News RSS Feed - Atomic Force Microscopes

New Partnership Provides Quality Training Programs in Atomic Force Microscopy

New Partnership Provides Quality Training Programs in Atomic Force Microscopy

Dalia Yablon, Ph.D. and Paul E. West, Ph.D, two leading experts in scanning probe/atomic force microscopy (SPM/AFM) with decades of experience between them, are teaming up to help de-mystify their field and make it more accessible to scientists and engineers. [More]
Researchers Optimize New AFM System for Live-Cell Imaging

Researchers Optimize New AFM System for Live-Cell Imaging

Researchers at the Max Planck Florida Institute for Neuroscience and Kanazawa University (Japan) have succeeded in imaging structural dynamics of living neurons with an unprecedented spatial resolution [More]
Park and imec Partner to Develop Nanoscale AFM Metrology Solutions for Semiconductor Wafer Production

Park and imec Partner to Develop Nanoscale AFM Metrology Solutions for Semiconductor Wafer Production

Park Systems, world-leader in Atomic Force Microscopes (AFM) announced today they have signed a Joint Development Project (JDP) with nanoelectronics research center imec, to develop in-line AFM metrology solutions of future technology nodes including but not limited to surface roughness, thickness, critical dimension (CD), and sidewall roughness. [More]
Park Systems Joins Forces with imec to Develop Advancements in Nanoscale AFM Metrology Solutions for Semiconductor Manufacturing

Park Systems Joins Forces with imec to Develop Advancements in Nanoscale AFM Metrology Solutions for Semiconductor Manufacturing

Park Systems, world-leader in Atomic Force Microscopes (AFM) announced today they have signed a Joint Development Project (JDP) with nanoelectronics research center imec, to develop in-line AFM metrology solutions of future technology nodes including but not limited to surface roughness, thickness, critical dimension (CD), and sidewall roughness. [More]
AXT Announce Distribution Partnership with NT-MDT in Australia and New Zealand

AXT Announce Distribution Partnership with NT-MDT in Australia and New Zealand

AXT would like to announce its new partnership with NT-MDT, one of the world’s leading manufacturers of Atomic Force Microscopes (AFM). [More]
Conventional Patch-Clamp Technique Combined with AFM Helps Record Activity of Moving Cells

Conventional Patch-Clamp Technique Combined with AFM Helps Record Activity of Moving Cells

Electrical impulses play an important role in cells of the human body. For example, neurons use these impulses to transmit information along their branches and the body also uses them to control the contraction of muscles. [More]
Highest Values of Piezoresistivity in Electroceramic Material Measured Using Atomic Force Microscopy

Highest Values of Piezoresistivity in Electroceramic Material Measured Using Atomic Force Microscopy

ICN2 Oxide Nanoelectronics Group obtains conductivity values for stroncium iridate 250 times higher than in normal conditions, just pressing with nanometric needles. The results, published in Nanoscale, where obtained thanks to the use of the atomic force microscope (AFM) showing that the material could become a good candidate for future applications in sensors and electronics. [More]
Electricity and Water Help Control Nanoscale Friction on Ionic Surfaces

Electricity and Water Help Control Nanoscale Friction on Ionic Surfaces

Researchers at the Department of Energy’s (DOE) Oak Ridge National Laboratory (ORNL) have discovered a new method to control friction in ionic solids at the nanoscale using ambient water vapor and electrical stimulation. Friction affects motion and hence frictional forces have to be controlled. Traditionally, lubrication or mechanistic means have been used for controlling friction forces. [More]
NT-MDT Installs Unique AFM with RAMAN, TERS, and SNOM Capabilities at University of Limerick

NT-MDT Installs Unique AFM with RAMAN, TERS, and SNOM Capabilities at University of Limerick

The University of Limerick has received one of Europe's most powerful microscopes supported by NT-MDT, a world-leading manufacturer of atomic force based microscopes (AFM). NT-MDT recently installed a unique Atomic Force Microscope with RAMAN, TERS, and SNOM capabilities (NTEGRA Spectra). [More]
Oxford Instruments Asylum Research Announces  AFM Image Contest Winners

Oxford Instruments Asylum Research Announces AFM Image Contest Winners

Oxford Instruments Asylum Research is pleased to announce the winners of its AFM Image Contest. [More]
Site Sponsors
  • Park Systems - Manufacturer of a complete range of AFM solutions
  • Strem Chemicals - Nanomaterials for R&D