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DNA Nanostructures Assembled in Waterless Solvent

DNA Nanostructures Assembled in Waterless Solvent

Scientists around the world are using the programmability of DNA to assemble complex nanometer-scale structures. Until now, however, production of these artificial structures has been limited to water-based environments, because DNA naturally functions inside the watery environment of living cells. [More]
ZEISS Devlops MeRiT neXT Low Energy-Beam Mask Repair System

ZEISS Devlops MeRiT neXT Low Energy-Beam Mask Repair System

The new ZEISS MeRiT neXT mask repair tool hosts the innovative ZEISS low energy ebeam column, which enables the repair of smallest possible clear and opaque defects with the highest accuracy. The low energy beam increases the process resolution and simultaneously reduces side effects. [More]
NT-MDT Hosts Workshop on AFM, Raman, SNOM & TERS Techniques at Bath University

NT-MDT Hosts Workshop on AFM, Raman, SNOM & TERS Techniques at Bath University

NT-MDT were delighted to host a workshop for our customers in Bath University on Thursday and Friday 7th to 8th of May 2015. The workshop was opened by Jessica Ryan from the Sales and Marketing Team in Limerick, Ireland. [More]
TASC Algorithm Extended to Create Nanoscale Method for Studying Components Distribution in Solid Mixtures

TASC Algorithm Extended to Create Nanoscale Method for Studying Components Distribution in Solid Mixtures

A LEADING innovator in the field of thermal analysis – vital in many fields of advanced manufacturing – has teamed up with the University of Huddersfield for research that will lead to the development of a number of completely new analytical techniques. [More]
Park Launches New High Vacuum SSRM AFM System for Semiconductor Failure Analysis - NX-Hivac

Park Launches New High Vacuum SSRM AFM System for Semiconductor Failure Analysis - NX-Hivac

Park Systems, world-leader in atomic force microscopy (AFM) today announced NX-Hivac, the only high vacuum AFM system in the market that meets the current and future needs for failure analysis semiconductor manufacturing. [More]
Oxford Instruments Asylum Research and MRS OnDemand® Present “Beyond Topography:  New Advances in AFM Characterization of Polymers” on May 28, 2015

Oxford Instruments Asylum Research and MRS OnDemand® Present “Beyond Topography: New Advances in AFM Characterization of Polymers” on May 28, 2015

Oxford Instruments Asylum Research in conjunction with the Materials Research Society (MRS) will host the webinar “Beyond Topography: New Advances in AFM Characterization of Polymers”, May 28, 2015 at 11:00am ET. [More]
Researchers Study Atomic Scale Friction Using Atomic Force Microscopy

Researchers Study Atomic Scale Friction Using Atomic Force Microscopy

Technological limitations have made studying friction on the atomic scale difficult, but researchers at the University of Pennsylvania and the University of California, Merced, have now made advances in that quest on two fronts. [More]
Researchers Alter Thermal Conductivity of PZT Material Using a Small Electric Voltage

Researchers Alter Thermal Conductivity of PZT Material Using a Small Electric Voltage

Modern research has found no simple, inexpensive way to alter a material's thermal conductivity at room temperature. [More]
Review Paper on Combining Atomic Force Microscopy and Infrared Spectroscopy (AFM-IR) Persists as a Top-Downloaded Publication

Review Paper on Combining Atomic Force Microscopy and Infrared Spectroscopy (AFM-IR) Persists as a Top-Downloaded Publication

Anasys Instruments, the pioneer in commercializing near-field infrared spectroscopy instrumentation, including AFM-IR, is pleased to direct readers to an in-depth review of AFM-IR technology published as a Focal Point article in the Journal of Applied Spectroscopy titled “AFM‐IR: Combining Atomic Force Microscopy and Infrared Spectroscopy for Nanoscale Chemical Characterization.” [More]
New Application Note Describes Nanomechanical Measurements on Diverse Materials Using the Asylum Research NanomechPro Toolkit

New Application Note Describes Nanomechanical Measurements on Diverse Materials Using the Asylum Research NanomechPro Toolkit

Oxford Instruments Asylum Research has released a new application note, “The NanomechPro™ Toolkit: Nanomechanical AFM Techniques for Diverse Materials,” written Dr. Donna Hurley, founder of Lark Scientific and former NIST project leader. [More]
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