Site Sponsors
  • Strem Chemicals - Nanomaterials for R&D
  • Park Systems - Manufacturer of a complete range of AFM solutions
  • Oxford Instruments Nanoanalysis - X-Max Large Area Analytical EDS SDD
Posted in | Nanoenergy | Nanoanalysis
Save 20% On a Jenway 7315 Spectrophotometer from Bibby Scientific

There is 1 related live offer.

20% Off Jenway Spectrophotometer

CRAIC Technologies Introduces QDI 2010 Film Microspectrophotometer Designed to Measure Thickness of Thin Films PV Cells

Published on July 7, 2009 at 10:37 PM

CRAIC Technologies, the leading manufacturer of UV-visible-NIR microscopes and microspectrometers, is pleased to announce the QDI 2010 Film™ microspectrophotometer. The QDI 2010 Film™ instrument is designed to measure the thickness of thin films of photovoltaic cells rapidly and non-destructively. Able to analyze films of many materials on both transparent and opaque substrates, the QDI 2010 Film™ enables the user to determine thin film thickness of even microscopic sampling areas.

This powerful tool also has a host of other functions. It can be combined with CRAIC Technologies proprietary contamination imaging capabilities and can even test the transmissivity of PV cell protective covers. As such, the QDI 2010 Film™ represents a major step forward in metrology instrumentation available to the photovoltaic industry.

"Many of our customers want to test the quality of photovoltaic devices for rapid quality control of their products. The QDI 2010 Film™ microspectrophotometer was built in response to customer requests for a powerful, flexible metrology tool that can test a number of different aspects of many different photovoltaic devices" says Dr. Paul Martin, President.

The complete QDI 2010 Film™ solution combines advanced microspectroscopy with sophisticated software to enable the user to measure film thickness by either transmission or reflectance of many types of materials and substrates. Due to the flexibility of the CRAIC Technologies design, sampling areas can range from over 100 microns across to less than a micron. Designed for the production environment, it incorporates a number of easily modified metrology recipes, the ability to measure new films and sophisticated tools for analyzing data. Other features such as contamination analysis and transmissivity testing are easily added to this instrument.

For more information about QDI 2010 Film™ microspectrophotometer and its applications, visit www.microspectra.com.

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Submit