Posted in | Nanomaterials

Malvern Welcomes the Release of New Standard for Particle Sizing Technique

Published on January 18, 2010 at 6:48 PM

As a global leader in the field of laser diffraction, Malvern Instruments has welcomed the release of ISO13320:2009, a new standard for this key particle sizing technique. Building on a knowledge base that has advanced significantly over the preceding decade, ISO13320:2009 is an essential resource for instrument manufacturers and users alike. By emphasising applications and the need for well-defined procedures, it also clearly points the way for future developments.

Commenting on the publication of the new standard, Paul Kippax, Malvern's Product Manager for Diffraction Products said, "Malvern has been happy to contribute expertise to shape this valuable document and is especially pleased that it includes much improved advice on method development and optical model selection. This reflects a marked growth in application knowledge in recent years. There is now substantial guidance to enable users to get the most from an investment in a laser diffraction analyzer. Looking to the future, the challenge for manufacturers is to reduce the burden of method development, making it easier for all users to fully exploit this knowledge base."

A pioneer of laser diffraction for more than three decades, and with a team of industrial specialists who cover every sector that routinely uses the technology, Malvern delivers the highest possible levels of application support. The company's well-established Mastersizer 2000 laboratory laser diffraction system already permits full implementation of the new guidance with respect to sampling, dispersion and measurement, allowing users to take immediate advantage of the latest advice. Malvern's definitive Masterclass series of on-demand webinars clearly and concisely covers the majority of topics raised in the new standard and providing a highly informative starting point for those wishing to adopt best practice, in line with the guidance enshrined in ISO13320:2009.

Read more in the article 'Setting new standards for laser diffraction particle size analysis' by Drs Alan Rawle and Paul Kippax of Malvern Instruments which examines each aspect of the measurement process for the revised ISO13320:2009 standard at http://www.malvern.com/common/downloads/campaign/MRK1399-01.pdf

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