LOT represent some of the top names in Metrology instrumentation such as KLA Tencor and Park Systems. We are currently offering the following promotions for a limited period.
Park XE-100 - Award-Winning Research-Grade AFM with Step-and-Scan Automation
LOT are now able to offer a limited number of brand new, factory delivered XE-100 AFMs at 20% off list price (includes 12 month warranty, delivery, installation and user training). These are current specification models. To view a typical specification please click here
The XE-100 is Park's flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology. It is a mid-priced system for materials science, polymers, electrochemistry and other applications in nanoscience and engineering. It can adopt a wide range of optical coupling with its open side access.
KLA-Tencor D-100 Stylus Surface Profiler
We are offering 20% off the list price (including 12 month warranty, delivery, installation and user training for a limited period.
The AlphaStep D-100 profilometer rapidly and quantitatively measures the 2D topography of surfaces. The AlphaStep D-100 profilometer measurement systems includes an 800 micron (optional 1.2 millimeter) Z range, sub-angstrom resolution, 6 angstrom step height repeatability, manual x-y theta sample positioning stage, and many other features. To view a typical specification please click here
KLA-Tencor MicroXAM-100 Optical Surface Profiler
We are offering 25% off the list price (including 12 month warranty, delivery, installation and user training for a limited period.
The MicroXAM -100 3D surface profiler can measure fields of view from 100 X 100 microns to 2.0 X 2.0 millimeters (dependent on the objective lens used). The MicroXAM 100 optical interferometer quickly and accurately measures the 3D topography of surfaces at the nanometer level with a z-scan range of 250 microns (or up to 10 mm with Z-Stitching). With the new 3D image stitching capabilities, multiple images can be stitched together to produce an extended fields of view. To view a typical specification please click here
For further information please contact Heath Young on 01372 378822, e-mail firstname.lastname@example.org