Posted in | Microscopy | Nanoanalysis

Carl Zeiss SMT Showcases a New Class of SEM at Microscopy Exhibition

Published on August 5, 2008 at 11:24 AM

At the Microscopy and Microanalysis Meeting and Exhibition being held in Albuquerque, New Mexico, Carl Zeiss SMT is introducing a new class of SEM: SIGMA. Growing customer demand for ease of use and class leading X-ray and analytical geometry took center stage when the product was developed.

New class of SEM centered on unique GEMINI technology: SIGMA.

The SIGMA, featuring the unique and proven GEMINI® technology from Carl Zeiss, provides outstanding imaging and analytical results from a field emission microscope with the capability to handle all material types. Material analysis at high resolution is provided by the class leading X-ray geometry for both energy and wavelength dispersive spectroscopy (EDS and WDS).

The SIGMA can handle specimens of up to 250 mm diameter and 145 mm tall. Furthermore, the coplanar chamber design provides the ideal geometry for simultaneous EDS and electron backscattered diffraction (EBSD).

GEMINI® as the market leading Field Emission design, offers unrivalled ease of use, superb low voltage imaging and ultra stable probe currents for analytical applications.

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