At the Microscopy and Microanalysis Meeting and Exhibition being held in
Albuquerque, New Mexico, Carl
Zeiss SMT is introducing a new class of SEM: SIGMA. Growing customer demand
for ease of use and class leading X-ray and analytical geometry took center
stage when the product was developed.
New class of SEM centered on unique GEMINI technology: SIGMA.
The SIGMA, featuring the unique and proven GEMINI® technology from Carl
Zeiss, provides outstanding imaging and analytical results from a field emission
microscope with the capability to handle all material types. Material analysis
at high resolution is provided by the class leading X-ray geometry for both
energy and wavelength dispersive spectroscopy (EDS and WDS).
The SIGMA can handle specimens of up to 250 mm diameter and 145 mm tall. Furthermore,
the coplanar chamber design provides the ideal geometry for simultaneous EDS
and electron backscattered diffraction (EBSD).
GEMINI® as the market leading Field Emission design, offers unrivalled
ease of use, superb low voltage imaging and ultra stable probe currents for
analytical applications.