LOT-Oriel Introduces Xi-100 Non-Contact Optical Profiler from Ambios Technology
Published on June 15, 2009 at 8:11 AM
The Xi-100 Non-Contact Optical Interferometer from Ambios Technology quickly
and accurately measures the 3D topography of surfaces at the nanometer level.
It is designed for the researcher who is interested in getting fast, repeatable
date from an instrument that is not encumbered by unneeded levels of complication.
Rapidly image areas in scale from microns to millimeters and the only instrument
adjustments are sample position and focus.
- Fast, non-destructive, 3-dimensional measurements
- Point and shoot operation
- High resolution, accuracy, and repeatability on smooth or rough surfaces
- Highly affordable
For more information please go to http://www.lot-oriel.com/site/pages_uk_en/products/xi100/xi100.php
or contact Heath Young on 01372 378822, e-mail firstname.lastname@example.org