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LOT -奥丽尔推出喜- 100非接触式光学轮廓Ambios技术

Published on June 15, 2009 at 8:11 AM

席- 100非接触式光学干涉Ambios技术迅速准确地测量纳米级表面三维地形。它是专为研究员谁是不必要的并发症,不担保文书得到快速,可重复的日期。快速规模从微米到毫米的唯一手段调整的图像区域样品的位置和重点。


  • 快速,非破坏性的,3维测量
  • 点和拍摄操作
  • 高的分辨率,精度,重复性和光滑或粗糙的表面上
  • 高度适中

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Last Update: 4. October 2011 06:21

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