Zeiss introduces EVO® HD, its latest innovation in the conventional
Scanning Electron Microscopy (C-SEM) market segment. Delivering much higher
resolution at low acceleration voltages compared to present conventional SEM,
the EVO® HD introduces High Definition to electron microscopy.
The technological basis for this achievement is the new EVO® HD source
which features a higher source brightness. This brightness results in an improvement
in resolution at low-kV relative to conventional tungsten SEMs. The improved
source properties also aid analytical applications with a 30% increase in resolution
at 30kV and 1nA.
“We are convinced that this is the most significant innovation in the
market for conventional SEM in the last decade. Numerous applications in both
life sciences and materials analysis will benefit from the increased performance”,
explains Allister Mc Bride from Carl Zeiss Nano Technology Systems division