Elucidating structural parameters of nanomaterials will be the hot topic at
the upcoming workshop ‘X-ray Scattering Methods for Characterization of
Nano-Materials’, to be held on December 3, 2010 during the MRS Fall 2010
conference in Boston, MA.
“This workshop is a unique opportunity to gain knowledge from the experts
in the field about the latest X-ray analytical tools available to scientists
and engineers for materials characterization”, states Dr. Robert L. Snyder,
Professor and Chair of the School of Materials Science and Engineering at the
Georgia Institute of Technology. Prof. Snyder is co-organizer of the workshop
along with Dr. Iuliana Cernatescu, Principal Scientist at PANalytical
Inc.
The aim of this workshop is to give the attendees insight into valuable characterization
tools to help unravel nanostructural parameters of samples and/or devices by
using X-ray diffraction and scattering techniques. Leading experts on each scattering
method will give a practical tutorial on how to apply different scattering methods
to nanomaterials characterization and what parameters can be extracted from
each method. Invited instructors include: Prof. Z. L. Wang and Prof. Robert
L. Snyder of Georgia Institute of Technology, Dr. Thomas Proffen of Los Alamos
National Laboratory, Dr. Andrew Payzant of the Center for Nanophase Materials
Sciences at Oak Ridge National Laboratory, Dr. Hans te Nijenhuis of PANalytical
B.V, the Netherlands and Dr. Iuliana Cernatescu of PANalytical Inc., USA. The
workshop will conclude with a field trip to tour PANalytical’s Applications
Laboratory in Westborough, MA where the participants can see the latest developments
in X-ray diffraction laboratory systems.
Researchers, scientists, academics, industrial laboratory staff, engineers,
educators and leading professionals in the field of nanotechnology, synthesis
and applications of nanomaterials, thin film, energy storage materials, solar
cells, H-storage materials, batteries and advanced materials will be able to
learn how classical and novel X-ray diffraction and scattering methods can help
in their work.
Registration for this workshop is possible from the website for MRS
Fall 2010.