Bruker has launched a Dimension FastScan Atomic Force Microscope (AFM), which delivers increased imaging speed while maintaining nanoscale resolution.
The device is time efficient, and delivers results in seconds. It offers enhanced volume productivity of atomic scale imaging throughout the scientific, biological, semiconductor, data storage and energy research segments.
The platform features multiple technologies in an endeavor to study and analyze nanomaterials to offer rapid scan speeds, high image resolution and precision. It is a tip-scanning system delivering measurements on large and nano size prototypes in air or liquids.
According to Mark R. Munch, president of the Bruker Nano Surfaces Division, the system allows scientists to use atomic force microscopy for applications that need rapid scanning.
David V. Rossi, vice president and general manager of Bruker’s AFM Business, said the platform offers users efficient access to nanoscale data. When combined with existing Bruker technologies including the ScanAsyst and PeakForce QNM, it delivers enhanced productivity , and enables methods that deliver quantitative data at the nanoscale. These features make it suitable for both academic research projects as well as production environments.