Research and Markets has announced the addition of the "Global Thin Film Metrology Systems Market 2014-2018" report to their offering.
One of the major trends emerging in the Global Thin Film Metrology Systems market is the increased R&D spending by the market vendors. Vendors such as Rudolph, KLA-Tencor, Nanometrics, and Nova Measuring Instruments have already invested a considerable amount of time and money in their R&D departments for the expansion of their product portfolios.
They are also increasingly investing in their R&D divisions to provide enhanced functionality and to meet the unsatisfied requirements of end-consumers. The R&D investments have enabled them to capture a significant market share and gain a competitive edge over the other vendors in the market.
According to the report, the high demand for thin film metrology systems for the development of flat panel displays is an important driver. These systems are used for measuring the thin films used in the flat panel displays of portable mobile devices such as smartphones, tablets, and e-readers.
Further, the report states that one of the key challenges in this market is the cyclical nature of the Semiconductor industry. The Semiconductor industry is one of the major end-users of thin film metrology systems, and any fluctuations in this industry inevitably leads to fluctuations in the Global Thin Film Metrology Systems market.
The study was conducted using an objective combination of primary and secondary information including inputs from key participants in the industry. The report contains a comprehensive market and vendor landscape in addition to a SWOT analysis of the key vendors.
Key Topics Covered:
01. Executive Summary
02. List of Abbreviations
03. Scope of the Report
04. Market Research Methodology
06. Market Landscape
07. Geographical Segmentation
08. Key Leading Countries
09. Buying Criteria
10. Market Growth Drivers
11. Drivers and their Impact
12. Market Challenges
13. Impact of Drivers and Challenges
14. Market Trends
15. Trends and their Impact
16. Vendor Landscape
17. Key Vendor Analysis
18. Other Reports in this Series
Nova Measuring Instruments
Rudolph Technologies Inc.
For more information visit http://www.researchandmarkets.com/research/b29wtt/global_thin_film