Dec 8 2008
LogicVision, Inc. (NASDAQ:LGVN), a leading provider of semiconductor built-in-self-test (BIST), built-in self-repair (BISR) and diagnostic solutions, and Dolphin Technology, Inc. a leading provider of performance-optimized SoC memory cores and performance-matched standard cell libraries and Input/Outputs (IOs), today announced that Dolphin Technology is offering an integrated high-performance and high-yield embedded memory solution that combines the best-in-class technologies from both companies.
One of the most notable consequences of the semiconductor industry moving to deeper nanoscale technology nodes is the significant growth in the number, density and performance requirements of embedded memories. Embedded memories now also represent, in most cases, a die's largest contributor to yield loss due to the very large area and density of these regular circuits. A successful memory strategy must not only include highly-optimized memories, but must also incorporate an efficient and effective repair methodology in order to achieve maximum yield levels without impacting test times or crucial time-to-market goals.
The integrated LogicVision-Dolphin memory solution delivers a broad range of highly-optimized memory blocks, including the industry's highest performance, highest density and lowest power memories. These memories have been proven in hundreds of designs across several silicon process generations down to 45nm. The integrated solution provides unique automation for efficiently integrating and verifying embedded memory test and repair capabilities within even the most complex designs. Once integrated, these capabilities provide the highest quality test through the industry's only BIST architecture that offers full algorithm programmability, as well as the highest possible yield improvement through fully optimized on-chip repair analysis and eFuse management. The integrated solution also provides very powerful automated diagnostic capabilities that allow crucial first silicon characterization as well as quick identification of any systematic process-related effects.
"Many of our customers use LogicVision's memory BIST and self-repair solutions as these provide the key test, repair and diagnostic capabilities they require." said Mo Tamjidi, president of Dolphin. "It makes sense therefore for us to offer a combined solution that provides our customers with an even more seamless path to incorporating the highest performance and highest yielding embedded memory solution in the industry".
"Dolphin memories are being adopted by an increasing number of our customers," said Jim Healy, president and CEO of LogicVision. "Our new relationship with Dolphin will ensure that we maximize the benefits our customers receive from both our existing and future integrated products and solutions".