Search

Request for Quote (RFQ): If you'd like us to help you source a Quotation for any particular products or from any suppliers, please click here. Once submitted, we will try and place you in contact with a suitable supplier within 48 hours.

Search is Loading...

Results 1 - 10 of 178 for AFMs.

Next>

NANOSENSORS Introduces the Next Generation of AFM Probes - New Product

NANOSENSORS have introduced a revolutionary new probe type for Atomic Force Microscopy - the AdvancedTEC™. Posted July 31 2003

http://www.azonano.com/article.aspx?ArticleID=287 | 9 Dec 2003
Gold Nanoparticles on Modified Glass Surface as Height Calibration Standard for Atomic Force Microscopy Operating in Contact and Tapping Mode

A standard sample of gold colloids suitably immobilized on glass has been shown to be suitable for for Atomic Force Microscopy calibration at the nanoscale, operating in Contact Mode (CM) and Tapping...

http://www.azonano.com/article.aspx?ArticleID=1436 | 11 Nov 2005
Scanning Probe Microscopy (SPM), Atomic Force Microscopy and SPM Lithography - Methods of Operation

Scanning Probe Microscopy (SPM) is a powerful tool used to study surfaces and surface properties at nanometre resolution. Different operating modes for Scanning Tunneling Microscopes (STM) and Atomic...

http://www.azonano.com/article.aspx?ArticleID=1209 | 27 Apr 2005
Scanning Near-Field Optical Microscopy (SNOM or NSOM) - Different Methods of Operation

Scanning Near-Field Optical Microscopes (SNOM or NSOM) offer far greater resolution than traditional optical microscopes. Conducting experiments using SNOM, feedback mechanisms, Photon Scanning...

http://www.azonano.com/article.aspx?ArticleID=1205 | 21 Apr 2005
Hybrid Nitride AFM Probe for Contact Mode from Nanoworld - New Product

Nanoworld have introduced their new Hybid- Nitride probe for atomic force microscopy use in contact mode. Posted August 1 2004

http://www.azonano.com/article.aspx?ArticleID=1036 | 25 Aug 2004
FEI Company Breaks the 1 Angstrom High Resolution Imaging Barrier - New Technology

FEI Company announced today that scientists at the company's nanotechnology centre have broken the one Angstrom image resolution barrier with a 200kV transmission electron microscope (TEM). Posted...

http://www.azonano.com/article.aspx?ArticleID=733 | 5 Apr 2004
Scanning Probe Microscopes (SPMs) and Atomic Force Microscopes (AFMs) - Who Holds All the Patents?

As Scanning Probe Microscopes (SPM) and Atomic Force Microscopes (AFM) are still evolving, manufacturers are keen to protect their work by patenting many of the design changes. Which companies hold...

http://www.azonano.com/article.aspx?ArticleID=1374 | 24 Aug 2005
Enhanced Nanopositioning Resolution Using Patented DAC, Digital to Analog Converter, Control Technique Known As HyperBit from Physik Instrumente

Increasingly, DAC's are a limiting factor in nanopositioning resolution. A Physik Instrumente patented technology adds up to 10 bits of resolution to virtually any OEM DAC and popular PC analog I/O...

http://www.azonano.com/article.aspx?ArticleID=1589 | 7 Jun 2006
China’s Nanotechnology Revolution

China is investing heavily in advancing nanotechnology and aims to establish a national information network to co-ordinate R&D activities between academia and industry. This article looks at the...

http://www.azonano.com/article.aspx?ArticleID=1202 | 20 Apr 2005
Scanning Tunneling Microscopes (STM) - History, Overview of Analysis Methods and Future Developments

Scanning Tunneling Microscopes (STMs) were the first type of microscopes that let scientists study material at the atomic level. The history of STMs, how STMs work, operational techniques, the...

http://www.azonano.com/article.aspx?ArticleID=1373 | 24 Aug 2005

Result Page 12 3 4 5 6 7 8 9 10 Next