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Results 21 - 30 of 35 for CRAIC Technologies
  • Article - 21 Nov 2009
    In this applications paper, we examine a sample of carbon nanotubes deposited on a circular glass cover slip. In particular, microspectral analysis in absorbance and reflectance, as well as micro...
  • Article - 11 Sep 2009
    Raman microspectroscopy is the study of the interaction between light and matter in which the light that is inelastically scattered: a process called the Raman effect.
  • Article - 11 Sep 2009
    The UV-visible-NIR microspectrophotometer is designed to measure the spectrum of microscopic areas or microscopic samples. It can be configured to measure the transmittance, absorbance, reflectance,...
  • Article - 28 Apr 2008
    UV-visible-NIR microspectroscopic analysis of thin films on semiconductor wafers is one of the most common applications of the technique. The purpose of this article is to detail the utility of the...
  • Article - 28 Apr 2008
    UV-visible range microspectroscopy is an important technique for analysis of individual protein crystals. UV microspectroscopy is used for both the study of individual crystals optical properties as...
  • Article - 28 Apr 2008
    CRAIC Technologies has developed a broad spectral range microscope, the UVM-1 Ultraviolet Microscope. This unique microscope is designed for high resolution imaging throughout the ultraviolet, visible...
  • Article - 28 Apr 2008
    CRAIC Technologies is the worlds leading developer of UV-visible-NIR range scientific instruments for microanalysis. This article looks at pixel-to-pixel variations of color masks by transmission...
  • News - 10 Jan 2017
    The 308 PVTM is a cost effective, manual solution to add UV-visible-NIR absorbance, reflectance, fluorescence and polarization spectroscopy to your microscope. CRAIC Technologies, the worlds...
  • News - 24 Oct 2011
    CRAIC Technoloiges, the leading manufacturer of advanced UV-visible-NIR range systems for microscale analysis, announces the introduction of a live chat feature on its website microspectra.com ....
  • News - 3 Jul 2011
    CRAIC Technologies has developed a new solution for the semiconductor industry: the 20/20 XL Film Thickness Measurement Tool. The 20/20 XL is a microspectrophotometer is designed to non-destructively...

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