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Results 1 - 10 of 158 for Field-emission devices.

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Carbon Nanotube Particulates in Electron Emitters

Researchers have made carbon nanotubes (single and multi-walled) using a gaseous carbon-containing feedstock, combined with a catalyst on a magnesia particulate support. With high conductivity at low...

http://www.azonano.com/article.aspx?ArticleID=1146 | 30 Mar 2005
DuPont Donates Nanotechnology Patents To UC Davis - News Item

Dupont has donated a collection of patents and other intellectual property on using nanotechnology to generate electron beams to The University of California, Davis, College of Engineering. Posted...

http://www.azonano.com/article.aspx?ArticleID=478 | 6 Feb 2004
Ultraprecise Surface Processing Techniques - Potential Applications in Space

Ultraprecise surface processing techniques at the nanoscale have many potential uses in space applications. This article looks at production methods for ultraprecise surface figuring, defined...

http://www.azonano.com/article.aspx?ArticleID=1101 | 24 Jan 2005
Novel Material Innovation Helps Improve Carbon Nanotube-Based Field Emission Devices

By Cameron Chai A research team at Monash University located in Australia, in partnership with researchers at CSIRO Process Science and Engineering has developed a potential and easily producible...

http://www.azonano.com/news.aspx?newsID=23823 | 23 Nov 2011
Focused Ion Beam (FIB) Microscope - Automated Gas Chemistry in Focused Ion Beam (FIB) Microscope by Omniprobe

Gas chemistries in the Focused Ion Beam (FIB) microscope play an important role in semiconductor metrology and process control. In the FIB in-situ lift-out process, gas-assisted etching speeds the...

http://www.azonano.com/article.aspx?ArticleID=2706 | 14 Oct 2010
Focused Ion Beam (FIB) Microscope - Nanomechanical Characterization in the Focused Ion Beam Microscope by Omniprobe

The availability of the Focused Ion Beam (FIB) microscope with its excellent imaging resolution, depth of focus and ion milling capability have made it an appealing platform for materials...

http://www.azonano.com/article.aspx?ArticleID=2705 | 13 Oct 2010
Carbon Nanotubes, Nanoscience and Nanotechnology From The Nanotube Specialist Nanocyl

Nanocyl is a manufacturer of specialty and industrial carbon nanotubes, active in the nanotechnology. Nanocyl scientists and engineers continue to develop high quality grades of carbon nanotubes for...

http://www.azonano.com/article.aspx?ArticleID=1949 | 1 Aug 2007
3D Defect Characterization With the Expida 1285 DualBeam (FIB SEM) - Supplier Data By FEI Company

The Expida 1285 DualBeam (FIB / SEM) is a fast 3D defect characterization system that provides an accurate picture of your process, leading to increased control and improved yield.

http://www.azonano.com/article.aspx?ArticleID=1193 | 15 Apr 2005
Structural Analysis And SEM-STEM Imaging With The Strata 400 STEM DualBeam (FIB / SEM) – Supplier Data By FEI Company

The Strata 400 STEM DualBeam (FIB / SEM) supports analytical laboratories' increasing need for high resolution analytical capabilities as device geometries shrink below 100 nm and new material systems...

http://www.azonano.com/article.aspx?ArticleID=1192 | 15 Apr 2005
Field Emission Scanning Electron Microscopy For Industrial Process Laboratories Using the Quanta 200 3D DualBeam (FIB SEM) from FEI Company

The Quanta 200 3D DualBeam (FIB / SEM) is ideally suited to the industrial process control lab that must image or analyze multiple cross sections in challenging samples. For the materials science lab...

http://www.azonano.com/article.aspx?ArticleID=1191 | 15 Apr 2005

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