Phenom™, world’s fastest Desktop Scanning Electron Microscope takes your imaging performance to a higher level
Phenom™: stunning images, high throughput, ease of...
Phenom-World recently launched the new generation of their flagship Phenom benchtop SEMs. AZoNano's Will Soutter spoke to Phenom-World CEO Emile Asselbergs about the new Phenom, and the company's...
http://www.azonano.com/article.aspx?ArticleID=3646 | 2 Oct 2013
The Phenom is an award winning desktop high quality electron microscope. Its innovative user interface and intuitive touch screen control produce superb quality images with minimal operator training...
http://www.azonano.com/article.aspx?ArticleID=2237 | 28 Aug 2008
The ease of use, high throughput, and imaging power of the Phenom make it a valuable compliment to any analytical SEM laboratory. A 30-second load time and intuitive user-interface allow rapid imaging...
http://www.azonano.com/article.aspx?ArticleID=2236 | 28 Aug 2008
Now, an innovative benchtop imaging system by Phenom, FEI Company, combines the power of SEM with the speed and convenience of LM, delivering crisp, clear images at magnifications up to 24,000X with...
http://www.azonano.com/article.aspx?ArticleID=2235 | 28 Aug 2008
FEI Company's Phenom(TM), a new type of microscope, proves to be a valuable and cost-effective instrument for imaging and classification of diatoms at the Dutch Water Treatment and Control...
http://www.azonano.com/article.aspx?ArticleID=2234 | 19 Aug 2008
Tin whiskers have caused total system failures in computers, cell phones, missiles, and satellites. Analysts predict that these issues will become more frequent in this new solder-free semiconductor...
http://www.azonano.com/article.aspx?ArticleID=2233 | 19 Aug 2008
This application note illustrates how the Phenom can be used as a simple "point and shoot" instrument
for the rapid inspection and qualitative characterization of pharmaceutical particles.
http://www.azonano.com/article.aspx?ArticleID=2232 | 19 Aug 2008
The Phenom provides the extra magnification levels necessary to see paper fibers, fillers and coatings, and the depth-of-focus to clearly observe 3D surface phenomena. These capabilities can be used...
http://www.azonano.com/article.aspx?ArticleID=2231 | 19 Aug 2008
Rapid examination of common engineering alloys (e.g. Al, Ti, Fe and Ni) can be performed with the Phenom in areas such as routine metallurgical analysis, quality control, failure analysis, and...
http://www.azonano.com/article.aspx?ArticleID=2230 | 19 Aug 2008