Home
Home
Articles
News
Directory
Equipment
Experts
Classifieds
Books
News
Atomic Force Microscopes
Bionanotechnology
Carbon Nanotubes
Control Systems
Data Loggers
Dendrimers
Fullerenes
Graphene
Lab on a Chip
MEMS - NEMS
Microscopy
Nanoanalysis
Nanobusiness
Nanoelectronics
Nanoenergy
Nanoethics
Nanofabrication
Nanofluidics
Nanoindentation
Nanolithography
Nanomagnetics
Nanomaterials
Nanomedicine
Nanooptics and Nanophotonics
Nanoregulations
Nanosensors
Nanotoxicology
Quantum Dots
Articles
Latest Articles
Thought Leaders
Commercializing Nanotechnology
AZojono - Journal of Nanotechnology
Global Market Reports
Materials
Suppliers A to Z
Applications
Industries
Equipment
Aerosol Coating Equipment
AFM Tips, Probes, Cantilevers
Atom Probes
Atomic Emission Spectrometers
Atomic Force Microscopes (AFM)
Atomic Layer Deposition (ALD) Systems
Biomedical Atomic Force Microscopes (bio-AFM)
Calorimeters
Carrier Concentration Profiler
Control Systems
Cryogenic Probe Stations
Data Loggers
Dynamic Light Scattering Instruments
Electrical Conductivity Measurement Systems
Electron Backscattered Diffraction (EBSD) Systems
Ellipsometers
Energy Dispersive X-Ray Spectroscopy (EDS)
Flow Chemistry Reactors
Focused Ion Beam (FIB) Accessories
Focused Ion Beam (FIB) Systems
FT-IR and FT-NIR Spectrometers
Helium Ion Beam Microscopes (HIM)
Induction Heating
Micro Hardness Testers
Microfluidic Devices
Micropositioning Systems
Mills for Reducing Particle Size
Moisture Analyzers
Nanofiber Production Equipment
Nanoimprint Lithography Equipment
Nanoimprint Lithography Templates
Nanoindentation Testers
Nanolithography Systems
Nanoparticle Characterization Systems
Nanoparticle Production Systems
Nanopositioning Systems
Optical Characterization Systems
Optical Tweezers
Particle Size Analyzers
Photoluminescence Mapper
Piezo Actuators
Plasma Cleaning Systems
Plasma Etching Systems
Profilometers
Raman Spectrometers
Sample Preparation Equipment
Scanning Electron Microscope (SEM) Accessories
Scanning Electron Microscopes (SEM)
Scanning Near-Field Optical Microscopes (SNOM)
Scanning Probe Microscopes (SPM)
Scratch Testers
Separation Membranes
Spectrofluorometers
Spectrometers
Spectrophotometers
Spectroscopic Ellipsometers
Sputtering Systems
Streak Cameras
Surface Area Analyzers
TEM Sample Holders and Supplies
Thermal Analysis Equipment
Thermal Desorption Equipment
Thin Film and Coating Thickness Measurement Tools
Thin-Film Deposition Systems
Time Delay Inegration (TDI) Cameras
Transmission Electron Microscopes
Tribometers - Friction and Wear Testers
Ultrasonic Processing Equipment
Vibration Isolation Systems
Wafer Bonders
X-Ray Cameras
X-Ray Diffractometers
X-Ray Fluorescence Analyzers
Zeta Potential Analyzers
Classifieds
Books
Bionanotechnology
Carbon Nanotubes
Dendrimers
Fullerenes
MEMS - NEMS
Microscopy
Nanodevices
Nanoelectronics
Nanoenergy
Nanolithography
Nanomaterials
Nanomedicine
Nanotechnology
Nanotoxicology
Quantum Dots
Journals
Nanoelectronics
Nanoethics
Nanofabrication and Processing Technologies
Nanofluidics
Nanomagnetics
Nanomaterials
Nanomedicine
Nanooptics
Nanosensors
Nanotechnology
Quantum Physics
Spectroscopy
Videos
Atomic Force Microscopes
Graphene
ICONN 2010 Interviews
Lab on a Chip
Microfluidics - Devices and Systems
MRS 2008 Fall Meeting Video Interviews
MRS 2010 Fall Meeting Video Interviews
MRS 2011 Fall Meeting Video Interviews
MRS 2012 Fall Meeting Video Interviews
Nanoanalysis
NanoArt
Nanomanipulation
Nanomaterials
Nanooptics and Nanophotonics
Nanosensors
Nanotechnology and the Environment
Nanotechnology Applications
Nanotechnology in Aerospace
Nanotechnology in Energy
Nanotechnology in Medicine
Nanotechnology in Semiconductors
Nanotechnology Overviews
Nanotubes
Pittcon 2009 Video Interviews
Pittcon 2012 Interviews
Self Assembly
X-Ray Diffraction
Courses
Courses
Events
About
Contact
Meet the Team
Help/FAQs
Terms
Search
Advertise
May 18, 2013
Browse by:
Materials
|
Applications
|
Industries
About
Advertise
Terms
Site Sponsors
Latest Nano News
New Report on Prospects of the Global Nanotechnology Industry
Nanoantenna Pattern Enables New Way of Turning Infrared Light into Mechanical Action
Silica Nanoparticles Reduce Wear and Friction of PTFE
Berkeley Design Automation Introduces ACE System to Analyze Nanometer-Scale Analog and Mixed-Signal Circuits
Boron Added to Graphene May Make it Useful for High-Capacity Batteries
Site Sponsors
Search
Request for Quote (RFQ): If you'd like us to help you source a Quotation for any particular products or from any suppliers, please
click here
. Once submitted, we will try and place you in contact with a suitable supplier within 48 hours.
Videos
Experts
Journals
Courses
Events
Classifieds
Search is Loading...
All
News
Articles
Suppliers
Equipment
Books
More
Results
1
-
10
of
54
for
Polycarbonate
.
Search
Next>
Polycarbonate Skylight Panels With Nanogel Translucent Aerogel - New Product
Cabot Corporation, a leading global producer of specialty chemicals, has announced it has agreed to work with Super Sky Products, Inc., a division of Vitro America, to jointly produce and market a...
http://www.azonano.com/article.aspx?ArticleID=554
|
1 Mar 2004
Quality Control of Minidisk Polymer Topcoat With Nano Scratch Tester and Tribometer From CSM Instruments
The Minidisk surface tested in this article had a polycarbonate surface film of thickness 1.2 ìm and was characterised using the Nano Scratch Tester and the pin-on-disk Tribometer.
http://www.azonano.com/article.aspx?ArticleID=1805
|
5 Dec 2006
Characterization of Polymeric Materials Using nanoIR
The nanoIR system from Anasys Instruments enables IR Spectroscopy with 100 nm spatial resolution. It also provides high resolution topographic, mechanical, chemical, and thermal mapping. Applications...
http://www.azonano.com/article.aspx?ArticleID=2922
|
19 Jul 2011
Creep Behaviour Investigation Using Micro or Nano Indentation Tester (MHT/NHT) From CSM Instruments
It has been shown that the indentation creep can be easily determined using the CSM Instruments Micro and Nano Indentation Tester (MHT and NHT). The indentation creep coefficient is defined as the...
http://www.azonano.com/article.aspx?ArticleID=1801
|
5 Dec 2006
Scanning Probe Microscopy (SPM) Analysis of CD or DVD Discs and Stampers by NT-MDT
Compact Discs (CD) and Digital Versatile Discs (DVD) are popular data storage now. The information unit of CD/DVD is so called pit. Properties of the stamper that make the pit and the pit itself are...
http://www.azonano.com/article.aspx?ArticleID=1542
|
4 May 2006
Evident Technologies Introduces EviDot Composites - New Product
Evident Technologies announced today that it is the first company to make commercially available a composite of quantum dots (semiconductor nanocrystals) in common polymers and matrix materials....
http://www.azonano.com/article.aspx?ArticleID=647
|
19 Mar 2004
Polyalkylene Carbonate Organic Binders for Nanoparticles - QPAC by Empower Materials
QPAC® 40 polypropylene carbonate and QPAC® 25 polyethylene carbonate are used as organic binders in several nanoparticle related applications. Details of these applications and properties of these...
http://www.azonano.com/article.aspx?ArticleID=2648
|
1 Aug 2010
Fraunhofer Scientists Impregnate Polycarbonate with Nanoparticles
CO2 is more than just a waste product. In fact, it has a variety of uses: the chemical industry makes use of this colorless gas to produce urea, methanol and salicylic acid. Urea is a fertilizer,...
http://www.azonano.com/news.aspx?newsID=21106
|
4 Jan 2011
Polycarbonate Nanocomposites Could Soon Improve Integrity of Electronics in Aircraft, Computers and iPhones
If one University of Houston professor has his way, the inexpensive plastic now used to manufacture CDs and DVDs will one day soon be put to use in improving the integrity of electronics...
http://www.azonano.com/news.aspx?newsID=11528
|
15 May 2009
Imaging of Chemical Micropatterns on Polycarbonate for Peptide Immobilization
In this study, a new method is described for micropatterning polycarbonate surfaces for biomolecular interaction studies. The SARFUS technique allows rapid characterisation of the micropatterns.
http://www.azonano.com/article.aspx?ArticleID=3019
|
3 Jun 2012
Result Page
1
2
3
4
5
6
Next