Renishaw manufactures a wide range of optical spectroscopy products, including:
Compact process monitoring Raman spectrometers
Raman analysers for scanning electron...
Nanoscale imaging is a rapidly evolving field. Several techniques are available for sample characterization. Here the benefits of having a single system integrating different analysis methods such as...
http://www.azonano.com/article.aspx?ArticleID=2989 | 12 Mar 2012
Nanotechnology is having a profound impact on new instrumentation for microscopy
and imaging, driving next-generation technologies toward smaller footprints,
sleeker profiles, more economical...
http://www.azonano.com/news.aspx?newsID=6996 | 30 Jul 2008
By placing a Nanonics AFM NSOM microscope with its free optical axis, onto a standard Raman microscope, for the first time it is possible to integrate the separate worlds of Raman and AFM. The...
With co-locataed instruments, researchers can study samples using Raman and SPM techniques providing detailed information about nanoscale properties and composition. TERS promises to push the...
http://www.azonano.com/article.aspx?ArticleID=2943 | 19 Oct 2011
The Renishaw structural and chemical analyser (SCA) unites two well-established technologies, scanning electron microscopy (SEM) and Raman spectroscopy, resulting in a powerful and unique technique...
The Innova atomic force microscope from Bruker provides more performance and flexibility at a greater value than any other SPM. The proprietary closed-loop scan delivers noise-levels that approach...
The NTEGRA SPECTRA is a unique integration of Scanning Probe Microscope and confocal microscopy/luminescence and Raman scattering spectroscopy. Owing to the effect of huge tip enhanced Raman...
Surface-enhanced Raman spectroscopy (SERS) is a technique allowing greatly increased Raman signals used for trace detection and characterization of biological specimens with extremely high spatial...
http://www.azonano.com/article.aspx?ArticleID=1993 | 3 Oct 2007
D3 Technologies Ltd,
a world leading provider of trace level detection technologies based on the
exploitation of Surface-Enhanced Raman Scattering (SERS) and Surface-Enhanced
http://www.azonano.com/news.aspx?newsID=15800 | 7 Feb 2010