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Results 11 - 20 of 172 for Semiconductor Polishing
  • ACM Research, Inc.
    Supplier Profile
    Founded in 1998 in Silicon Valley, ACM Research, Inc. develops wet processing technology and products for the semiconductor industry. The company has produced equipment for a range of applications in...
  • Amtech Systems
    Supplier Profile
    Amtech Systems, Inc. manufactures capital equipment, including silicon wafer handling automation, thermal processing equipment and related consumables used in fabricating solar cells and...
  • Attolight
    Supplier Profile
    Attolight, a Swiss company that originated in the EPFL Laboratory of Quantum Optoelectronics (LOEQ), has revolutionized micro-cathodoluminescence (CL).  Capitalizing on core expertise in the...
  • Dynatex International
    Supplier Profile
    Dynatex International has been the leader in dry process dicing and wafer dicing materials since 1958. We are committed to provide solutions for die/diode dicing and wafer processing applications...
  • Accumet Engineering Corporation
    Supplier Profile
    Since 1970, Accumet Engineering has provided a complete ultra-precision service for grinding, lapping, polishing, diamond sawing, laser machining, sizing a wide variety of metals (ferrous...
  • MotiCont
    Supplier Profile
    MotiCont is a manufacturer of motion control products. The company's product line includes voice coil motors, three phase brushless motors and positioning stages and slides. All products are...
  • LatticeGear
    Supplier Profile
    LatticeGear is passionate about sample preparation and the under appreciated art of scribing and cleaving.   They help their customers get to the business of imaging and analysis faster. Their...
  • ICSPI (Integrated Circuit Scanning Probe Instruments)
    Supplier Profile
    Atomic Force Microscopes (AFMs) are versatile instruments that interact with surfaces at the nanometer scale. By "feeling" a sample using a very sharp needle, not unlike the way a record...
  • Using Scanning Microwave Impedance Microscopy for Nanoscale Mapping of Permittivity and Conductivity
    Article - 13 May 2016
    Scanning microwave impedance microscopy, also known as sMIM, is an atomic force microscopy (AFM)-based method used for the characterization of materials and devices.
  • Cabot Epic D100 CMP Receives SI Magazine's "Editors' Choice Best Products" Award For 2009
    News - 15 Jul 2009
    Cabot Microelectronics Corporation (Nasdaq:CCMP), the world's leading supplier of chemical mechanical planarization (CMP) polishing slurries and growing CMP pad supplier to the semiconductor...

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