Home
Home
Articles
News
Directory
Equipment
Experts
Classifieds
Books
News
Atomic Force Microscopes
Bionanotechnology
Carbon Nanotubes
Control Systems
Data Loggers
Dendrimers
Fullerenes
Graphene
Lab on a Chip
MEMS - NEMS
Microscopy
Nanoanalysis
Nanobusiness
Nanoelectronics
Nanoenergy
Nanoethics
Nanofabrication
Nanofluidics
Nanoindentation
Nanolithography
Nanomagnetics
Nanomaterials
Nanomedicine
Nanooptics and Nanophotonics
Nanoregulations
Nanosensors
Nanotoxicology
Quantum Dots
Articles
Latest Articles
Thought Leaders
Commercializing Nanotechnology
AZojono - Journal of Nanotechnology
Global Market Reports
Materials
Suppliers A to Z
Applications
Industries
Equipment
Aerosol Coating Equipment
AFM Tips, Probes, Cantilevers
Atom Probes
Atomic Emission Spectrometers
Atomic Force Microscopes (AFM)
Atomic Layer Deposition (ALD) Systems
Biomedical Atomic Force Microscopes (bio-AFM)
Calorimeters
Carrier Concentration Profiler
Control Systems
Cryogenic Probe Stations
Data Loggers
Dynamic Light Scattering Instruments
Electrical Conductivity Measurement Systems
Electron Backscattered Diffraction (EBSD) Systems
Ellipsometers
Energy Dispersive X-Ray Spectroscopy (EDS)
Flow Chemistry Reactors
Focused Ion Beam (FIB) Accessories
Focused Ion Beam (FIB) Systems
FT-IR and FT-NIR Spectrometers
Helium Ion Beam Microscopes (HIM)
Induction Heating
Micro Hardness Testers
Microfluidic Devices
Micropositioning Systems
Mills for Reducing Particle Size
Moisture Analyzers
Nanofiber Production Equipment
Nanoimprint Lithography Equipment
Nanoimprint Lithography Templates
Nanoindentation Testers
Nanolithography Systems
Nanoparticle Characterization Systems
Nanoparticle Production Systems
Nanopositioning Systems
Optical Characterization Systems
Optical Tweezers
Particle Size Analyzers
Photoluminescence Mapper
Piezo Actuators
Plasma Cleaning Systems
Plasma Etching Systems
Profilometers
Raman Spectrometers
Sample Preparation Equipment
Scanning Electron Microscope (SEM) Accessories
Scanning Electron Microscopes (SEM)
Scanning Near-Field Optical Microscopes (SNOM)
Scanning Probe Microscopes (SPM)
Scratch Testers
Separation Membranes
Spectrofluorometers
Spectrometers
Spectrophotometers
Spectroscopic Ellipsometers
Sputtering Systems
Streak Cameras
Surface Area Analyzers
TEM Sample Holders and Supplies
Thermal Analysis Equipment
Thermal Desorption Equipment
Thin Film and Coating Thickness Measurement Tools
Thin-Film Deposition Systems
Time Delay Inegration (TDI) Cameras
Transmission Electron Microscopes
Tribometers - Friction and Wear Testers
Ultrasonic Processing Equipment
Vibration Isolation Systems
Wafer Bonders
X-Ray Cameras
X-Ray Diffractometers
X-Ray Fluorescence Analyzers
Zeta Potential Analyzers
Classifieds
Books
Bionanotechnology
Carbon Nanotubes
Dendrimers
Fullerenes
MEMS - NEMS
Microscopy
Nanodevices
Nanoelectronics
Nanoenergy
Nanolithography
Nanomaterials
Nanomedicine
Nanotechnology
Nanotoxicology
Quantum Dots
Journals
Nanoelectronics
Nanoethics
Nanofabrication and Processing Technologies
Nanofluidics
Nanomagnetics
Nanomaterials
Nanomedicine
Nanooptics
Nanosensors
Nanotechnology
Quantum Physics
Spectroscopy
Videos
Atomic Force Microscopes
Graphene
ICONN 2010 Interviews
Lab on a Chip
Microfluidics - Devices and Systems
MRS 2008 Fall Meeting Video Interviews
MRS 2010 Fall Meeting Video Interviews
MRS 2011 Fall Meeting Video Interviews
MRS 2012 Fall Meeting Video Interviews
Nanoanalysis
NanoArt
Nanomanipulation
Nanomaterials
Nanooptics and Nanophotonics
Nanosensors
Nanotechnology and the Environment
Nanotechnology Applications
Nanotechnology in Aerospace
Nanotechnology in Energy
Nanotechnology in Medicine
Nanotechnology in Semiconductors
Nanotechnology Overviews
Nanotubes
Pittcon 2009 Video Interviews
Pittcon 2012 Interviews
Self Assembly
X-Ray Diffraction
Courses
Courses
Events
About
Contact
Meet the Team
Help/FAQs
Terms
Search
Advertise
May 19, 2013
Browse by:
Materials
|
Applications
|
Industries
About
Advertise
Terms
Site Sponsors
Latest Nano News
American Graphite Provides Update on Graphene Paper Project with CTI Nanotechnologies
New Report on Prospects of the Global Nanotechnology Industry
Nanoantenna Pattern Enables New Way of Turning Infrared Light into Mechanical Action
Silica Nanoparticles Reduce Wear and Friction of PTFE
Berkeley Design Automation Introduces ACE System to Analyze Nanometer-Scale Analog and Mixed-Signal Circuits
Site Sponsors
Search
Request for Quote (RFQ): If you'd like us to help you source a Quotation for any particular products or from any suppliers, please
click here
. Once submitted, we will try and place you in contact with a suitable supplier within 48 hours.
Videos
Experts
Journals
Courses
Events
Classifieds
Search is Loading...
All
News
Articles
Suppliers
Equipment
Books
More
Results
1
-
5
of
5
for
YBa2Cu3O7
.
Search
Examining High Transition Temperature Superconductor YBCO Thin Films Using NanoSurf Scanning Tunnelling Microscopes
From the STM experiment, typical defect mediated spiral growth hills can be observed. The step height of the growth hills correspond to the unit cell of the superconductor material YBa2Cu3O7 of 1.2nm.
http://www.azonano.com/article.aspx?ArticleID=1860
|
23 Feb 2007
Establishment Of A Technique For Production Of High-Performance Thin Films With Laser Irradiation - Enabling The Provision Of The World's Highest Quality Superconducting Thin Films At A Low Price
AIST has obtained results which reverse the conventional wisdom that superconducting films formed by processes needing a vacuum atmosphere are of high performance but expensive, while superconducting...
http://www.azonano.com/article.aspx?ArticleID=1740
|
22 Sep 2006
ALBA Synchrotron Commences Function as a Research Tool
By Will Soutter The ALBA synchrotron facility near Barcelona, Spain, has commenced operations as a research tool wherein the BOREAS line amongst the existing seven beamlines has been allocated for...
http://www.azonano.com/news.aspx?newsID=25019
|
12 Jun 2012
Reduction in Mechanical Strain at Crystal Grains Boundaries Significantly Improve Performance of HTS
Researchers at the National Institute of Standards and Technology (NIST) have discovered that a reduction in mechanical strain at the boundaries of crystal grains can significantly improve...
http://www.azonano.com/news.aspx?newsID=12097
|
16 Jun 2009
Measuring Atomic Spacings Down to a Few Picometres
Jülich scientists have succeeded in precisely measuring atomic spacings down to a few picometres using new methods in ultrahigh-resolution electron microscopy. This makes it possible to...
http://www.azonano.com/news.aspx?newsID=6934
|
25 Jul 2008
Result Page
1