Carbon Design Innovations
1745 Adrian Rd. Unit #20
Burlingame
California, 94010
United States
PH: 1 (650) 6977070
Fax: 1 (650) 6480581
Email: info@cdi-nano.com
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Primary Activity
Manufacturer of carbon nanotube devices
Company Background
In January 2008, Ramsey M. Stevens, founded Carbon
Design Innovations (C|D|I) in February, 2008 to commercialize a process
for the deterministic nanofabrication of carbon nanotubes (CNTs) that was developed
while he was working at the Center for Nanotechnology at NASA, Ames Research
Center and subsequently perfected at Modus, Inc. Stevens, recognized as a world
leader in the development and use of CNTs, developed the intellectual property
(IP) that is the basis for C|D|I
product development.
The result is the commercial availability of CNT probes for Atomic Force Microscopy
(AFM), with predicable characteristics, in volume. They give users the capability
to make the next major advancements in AFM research and deliver the full promise
of CNT probes.
Quick Facts
- Founded in 2008, Angel funded in 2009
- $400K in venture funding
Products
CNT AFM Probes
The next big leap for AFM tools is acknowledged to hinge on advancements in
probe technology. CNT AFM Probes from C|D|I
are engineered from the micro to the nanoscale with precise dimensions, angles
and material properties offering longer lifetime, higher resolution and greater
flexibility than existing Si, SiN or CNT AFM probe products.
The CCHAR high-aspect ratio CNT AFM probe, are designed for critical dimension
measurements and imaging high-Z structures in materials science, metrology and
life science applications. The standard CNT probe length is approximately 1µm
overall with < 500nm of exposed CNT tip. These two dimensions can also be
custom engineered to user specifications.
The CCHR high-resolution CNT AFM probes are designed for detailed imaging
in metrology and materials science applications. The standard CNT probe length
is 500 nm, with the exposed CNT tip <200 nm.
Increased Productivity and Reduced Cost-of-Ownership
CNT AFM Probes from C|D|I
are straight, strong and durable. These characteristics mean that users can
use a single probe to scan the same sample, or scan side-by-side samples, and
get consistent results. In addition, they have less down time due to the need
to change probes and the longer lifetimes reduce the overall cost-of-ownership.