An innovative standard has been set by Bruker’s Hysitron XPM in the area of nanomechanical testing throughput, coupled with precision and measurement resolution. The conventional nanoindentation methodologies take a longer time period to collect data when compared to XPM, which collects more data within a matter of hours. These novel performance capabilities are due to the combination of three key Hysitron technologies, which include top-down in-situ SPM imaging, rapid control and data acquisition electronics, and a high bandwidth electrostatically actuated transducer. All three synchronized technologies are capable of executing six measurements/second to obtain detailed quantitative nanomechanical property maps as well as property distribution statistics in a rapid manner.
Measure More in Less Time
Nanomechanical testing was invented to specifically determine highly localized mechanical properties. It is possible to spatially organize and plot arrays of separate measurements to create maps of mechanical property gradients over a surface. A conventional nanoindentation measurement takes about 90 seconds and a 20 x 20 array would take 10 hours to complete. The same data set can be collected in just 1.1 minutes using Bruker’s advanced XPM ultra-fast property mapping.
- Suitable for all Hysitron TI Series nanomechanical test instrument
- A 400 point mechanical property map is carried out in just 67 seconds (Figure 1)
- A powerful tip area function calibration is obtained within a minute
- High-resolution mapping of hardness and modulus with distribution statistics is performed rapidly (Figure 2)
- Six ultra-high speed quantitative mechanical property measurements are obtained per second
Figure 1. (A) Ceramic matrix composite modulus map - 400 measurements in 67 seconds. (B) Ceramic matrix composite modulus distribution statistics.
Figure 2. 10,000 point hardness (top) and modulus (bottom) maps on a DP 980 cold rolled steel alloy.
Easy Operation and Analysis
Bruker’s Hysitron TriboScan® control and data analysis software package has a built in intuitive XPM test function editor. The operator only has to define the indentation load function, the spacing between measurements, and the number of measurements to be performed. The optical and scanning probe microscopy methods can both be used to arrange the XPM property maps on the sample in a precise manner. Property distribution histograms and spatially resolved property maps are automatically generated after the completion of the XPM routine. Figure 3 shows a Cu-W alloy modulus map superimposed on an in-situ SPM image.
Figure 3. Cu-W alloy modulus map overlaid on an in-situ SPM image.
Bruker’s XPM, unlike other nanomechanical test instruments, quickly provides an entire picture, illustrating the spatial distribution of localized mechanical properties in inhomogeneous materials and also accurately reports on the property values on homogeneous materials. In addition, even the most basic and time consuming system calibrations, like the tip area function, become ~500x faster. XPM allows users to spend less time on collecting data and more time on understanding their materials.
This information has been sourced, reviewed and adapted from materials provided by Bruker Nano Surfaces.
For more information on this source, please visit Bruker Nano Surfaces.