RISE Microscopy is a novel correlative microscopy technique that combines confocal Raman Imaging and SEM to link ultra-structural surface properties with molecular compound information.
The RISE Microscope combines all features of a stand-alone SEM and the witec360 confocal Raman imaging microscope within one instrument.
Key Features
- Quick and convenient switching between Raman and SEM measurement
- Automated sample transfer from one measuring position to the other
- Integrated software interface for user-friendly measurement control
- Correlation of the measurement results and image overlay
- No compromise in SEM or Raman imaging capabilities
Correlative Raman-SEM (RISE) image of a graphene flake. The colors indicate the graphene layers and wrinkles. Image Credit: Oxford Instruments
RISE image of a gallium arsenide sample. Gold substrate (yellow), GaAs (red) and residues from production (blue). Image Credit: Oxford Instruments
Raman spectral image of the mineral phase of a diorite rock section, overlaid onto the SEM image. Raman single spectra acquired from the three distinct regions with the characteristic Raman bands of quartz (brown), epidot (red) and plagioclase (green). Image Credit: Oxford Instruments