Scanning Near-field Optical Microscope (SNOM): WITec alpha300 S

WITec’s alpha300 S is a user-friendly and robust Scanning Near-field Optical Microscope that combines the benefits of SNOM with atomic force microscopy and confocal white-light microscopy in one instrument.

Users can quickly switch between the different measuring modes by rotating the objective turret. The alpha300 S uses unique and patented micro-fabricated cantilever SNOM sensors that significantly outperform standard fiber optic probes in resolution, transmission, ease of operation and reliability. They employ the well-established beam deflection principle for distance control and feature a hollow pyramid with an aperture at its apex to acquire topographic and optical images simultaneously.

Many scientific fields can benefit from optical microscopy with spatial resolution beyond the diffraction limit, including semiconductor research, life science, materials science, pharmaceutics and others.

Key Features of the alpha300 S

  • Spatial resolution beyond the diffraction limit (ca. 60 nm laterally)
  • Transmission, reflection and collection modes
  • Can be used with ease in liquids and air
  • Fixed-bottom illumination (optional)
  • Total internal reflection illumination (optional)
  • Exclusive patented SNOM sensor method
  • Acquisition of force-distance curves and light-distance curves
  • Several AFM modes included
  • Combinable with confocal Raman imaging in one microscope

SNOM image of a surface plasmon-polariton wave launched on a nano-structured metal grid.

SNOM image of a surface plasmon-polariton wave launched on a nano-structured metal grid. Image Credit: WITec GmbH

SNOM image of a two-phase polymer mixture.

SNOM image of a two-phase polymer mixture. Image Credit: WITec GmbH

Super-resolution SNOM image of the nucleus of a rat hepatocyte.

Super-resolution SNOM image of the nucleus of a rat hepatocyte. Image Credit: WITec GmbH  

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