The alpha300 A Atomic Force Microscope from WITec is a versatile and powerful nano-imaging system integrated with a research-grade optical microscope. It offers easy cantilever alignment, superior optical access and high-resolution sample survey.
WITec’s AFMs are designed and built to be combined with other imaging methods such as confocal Raman imaging and Scanning Near-field Optical Microscopy. By simply rotating the microscope turret, the researcher can select from several techniques.
Whether users are working in air or liquid environments, or with fragile or soft samples, the alpha300 A is well suited to examining topographic structures at the highest resolution. The system can be fitted with the advanced Pulsed Force Mode intermittent contact module for materials research imaging applications.
Other microscopy methods than can incorporated with the AFM include fluorescence, polarization analysis, photoluminescence, and dark field and bright field imaging.
Key Features of the alpha300 A
- Surface characterization on the nanoscale
- Straighforward sample access from all directions
- Many available AFM modes
- Convenient cantilever exchange and alignment
- Can be used easily in liquids and air
- Accurate TrueScan™ controlled scanning stages
- Available integration with Scanning Near-field Optical Microscopy (SNOM) and confocal Raman imaging in a single microscope
AFM topography image of a steel surface. Image Credit: WITec GmbH
Digital Pulsed Force Mode image of fossilized bacteria. Image Credit: WITec GmbH
Magnetic Force Measurement of a hard drive disk. The measurements were performed using AC mode technique with magnetic tips. Image Credit: WITec GmbH