Explore the latest advancements in nanotechnology with this curated eBook on Atomic Force Microscopy (AFM). This essential collection highlights innovative applications of AFM across materials characterization, semiconductor manufacturing, biomedical research, and more.

Packed with insights from industry experts, pioneering studies, and emerging technologies—including AI-enhanced imaging and photothermal spectroscopy—this eBook offers a practical, in-depth resource for researchers, engineers, and innovators working at the forefront of nanoscale analysis.
Stay informed with Bruker's most-read articles covering AFM’s role in nanomechanical measurements, surface mapping, and electrical property characterization. Whether you're an academic, an industry professional, or simply passionate about cutting-edge technology, this eBook offers something for you.
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This information has been sourced, reviewed and adapted from materials provided by Bruker Nano Surfaces and Metrology.
For more information on this source, please visit Bruker Nano Surfaces and Metrology.